Inner-shell photoionization spectroscopy on deposited metal clusters using soft x-ray synchrotron radiation: An experimental setup

Review of Scientific Instruments

Volumn 80, Issue 12, 2009, Pages

  Peters, S ^a   Peredkov, S ^a   Balkaya, B ^a   Ferretti, N ^a   Savci, A ^a   Vollmer, A ^a   Neeb, M ^a   Eberhardt, W ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CLUSTER SYNTHESIS; DEPOSITED METAL; ELEMENT SPECIFIC; EXPERIMENTAL CONDITIONS; EXPERIMENTAL SETUP; GEOMETRICAL PROPERTY; MASS SELECTION; MASS-SELECTED CLUSTERS; NATURAL OXIDES; PHOTOIONIZATION SPECTROSCOPY; SI WAFER; SOFT LANDING; SOFT X-RAY;

ABSORPTION SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; PHOTOIONIZATION; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SYNCHROTRON RADIATION; SYNCHROTRONS; VACUUM; X RAY LITHOGRAPHY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 73849119006     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3267193     Document Type: Article

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