Inner-shell photoelectron spectroscopy of size-selected Cu-clusters on Si

Journal of Electron Spectroscopy and Related Phenomena

Volumn 156-158, Issue , 2007, Pages 124-127

  Ferretti, N ^a   Balkaya, B ^a   Vollmer, A ^a   Neeb, M ^a   Eberhardt, W ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Copper cluster; Deposited clusters; L edge spectroscopy; Photoelectron spectroscopy

Indexed keywords

DOPING (ADDITIVES); ENERGY ABSORPTION; IONIZATION; SILICON WAFERS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CLUSTER COVERAGE; DEPOSITED CLUSTERS; L-EDGE SPECTROSCOPY; NON-AGGLOMERATED CLUSTERS;

COPPER COMPOUNDS;

EID: 34247136677     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2006.11.017     Document Type: Article

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