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1
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49349086844
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Investigating and Modeling Total Ionizing Dose and Heavy Ion effects in Flash-Based Field Programmable Gate Array
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Athens, Greece
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J.J. Wang, N. Charest, G. Kuganesan, C.K. Huang, M. Yip, H.S. Chen, J. Borillo, S. Samiee, F. Dhaoui, J. Sun, S. Rezgui, J. McCollum and B. Cronquist, "Investigating and Modeling Total Ionizing Dose and Heavy Ion effects in Flash-Based Field Programmable Gate Array", RADECS 2006, Athens, Greece.
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RADECS 2006
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Wang, J.J.1
Charest, N.2
Kuganesan, G.3
Huang, C.K.4
Yip, M.5
Chen, H.S.6
Borillo, J.7
Samiee, S.8
Dhaoui, F.9
Sun, J.10
Rezgui, S.11
McCollum, J.12
Cronquist, B.13
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2
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49349096985
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New Methodologies for SET Characterization and Mitigation in Flash-Based FPGAs
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accepted for TNS
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S. Rezgui, J.J. Wang, E. Chan Tung, J. McCollum and B. Cronquist, "New Methodologies for SET Characterization and Mitigation in Flash-Based FPGAs", accepted for TNS 2007.
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(2007)
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Rezgui, S.1
Wang, J.J.2
Chan Tung, E.3
McCollum, J.4
Cronquist, B.5
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3
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33846285213
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Propagating SET Characterization Technique for Digital CMOS Libraries
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Dec
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M. P. Baze, J. Wert, J. W. Clement, M.G. Hubert, A. Witulski, O.A. Amusan, L. Massengill, and D. McMorrow, "Propagating SET Characterization Technique for Digital CMOS Libraries", IEEE TNS, Vol. 53, NO. 6, Dec. 2006, pp 3472-3478.
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(2006)
IEEE TNS
, vol.53
, Issue.6
, pp. 3472-3478
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Baze, M.P.1
Wert, J.2
Clement, J.W.3
Hubert, M.G.4
Witulski, A.5
Amusan, O.A.6
Massengill, L.7
McMorrow, D.8
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4
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34548705997
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SEU and SEU Modeling and Mitigation in Deep-Submicron Technologies
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Albuquerque, USA
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D. Mavis, and P. Eaton, "SEU and SEU Modeling and Mitigation in Deep-Submicron Technologies", IRPS 2007, pp 293-305, Albuquerque, USA.
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(2007)
IRPS
, pp. 293-305
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Mavis, D.1
Eaton, P.2
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5
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49349108830
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S. Rezgui, J.J. Wang, E. Chan Tung, B. Cronquist, and J. McCollum, Comprehensive SEE Characterization of 0.13-μm Flash-Based FPGAs by Heavy-Ion Beam Test, RADECS 07, Deauville, France.
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S. Rezgui, J.J. Wang, E. Chan Tung, B. Cronquist, and J. McCollum, "Comprehensive SEE Characterization of 0.13-μm Flash-Based FPGAs by Heavy-Ion Beam Test", RADECS 07, Deauville, France.
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7
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49349104364
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Radiation-Induced Multi-Bit Upsets in SRAM-Based FPGAs
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Dec
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H. Quinn, P. Graham. J. Krone, M. Caffrey, and S. Rezgui, "Radiation-Induced Multi-Bit Upsets in SRAM-Based FPGAs", IEEE TNS, Vol. 53, NO. 6, Dec. 2005, pp. 2455-2461.
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(2005)
IEEE TNS
, vol.53
, Issue.6
, pp. 2455-2461
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Quinn, H.1
Graham, P.2
Krone, J.3
Caffrey, M.4
Rezgui, S.5
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8
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49349109752
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J.J. Wang, RTAX EDAC-RAM Single Event Upset Test Report, Available: http://www.actel.com/documents/RTAX- S%20SEE%20EDAC%20RAM.pdf
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J.J. Wang, "RTAX EDAC-RAM Single Event Upset Test Report", Available: http://www.actel.com/documents/RTAX- S%20SEE%20EDAC%20RAM.pdf
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9
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33846387083
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An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays
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Dec
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M. Berg, J. J. Wang, R. Ladbury, S. Buchner, H. Kim, J. Howard, K. Label, A. Phan, T. Irwin, and M. Friendlich, "An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays", IEEE TNS, Vol. 53, NO. 6, Dec. 2006, pp 3569-3574.
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(2006)
IEEE TNS
, vol.53
, Issue.6
, pp. 3569-3574
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Berg, M.1
Wang, J.J.2
Ladbury, R.3
Buchner, S.4
Kim, H.5
Howard, J.6
Label, K.7
Phan, A.8
Irwin, T.9
Friendlich, M.10
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10
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33846322169
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Microdose Induced Dose Data Loss on floating Gate Memories
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Dec
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S. Guertin, D. Nguyen, and J. Patterson, "Microdose Induced Dose Data Loss on floating Gate Memories", IEEE TNS, Vol. 53, NO. 6, Dec. 2006, pp 3518-3524.
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(2006)
IEEE TNS
, vol.53
, Issue.6
, pp. 3518-3524
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Guertin, S.1
Nguyen, D.2
Patterson, J.3
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