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Volumn , Issue , 2008, Pages

New reprogrammable and non-volatile radiation tolerant FPGA: RTA3P

Author keywords

[No Author keywords available]

Indexed keywords

PARTICLE BEAMS; PROTONS; TESTING;

EID: 49349083165     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2008.4526472     Document Type: Conference Paper
Times cited : (25)

References (10)
  • 2
    • 49349096985 scopus 로고    scopus 로고
    • New Methodologies for SET Characterization and Mitigation in Flash-Based FPGAs
    • accepted for TNS
    • S. Rezgui, J.J. Wang, E. Chan Tung, J. McCollum and B. Cronquist, "New Methodologies for SET Characterization and Mitigation in Flash-Based FPGAs", accepted for TNS 2007.
    • (2007)
    • Rezgui, S.1    Wang, J.J.2    Chan Tung, E.3    McCollum, J.4    Cronquist, B.5
  • 4
    • 34548705997 scopus 로고    scopus 로고
    • SEU and SEU Modeling and Mitigation in Deep-Submicron Technologies
    • Albuquerque, USA
    • D. Mavis, and P. Eaton, "SEU and SEU Modeling and Mitigation in Deep-Submicron Technologies", IRPS 2007, pp 293-305, Albuquerque, USA.
    • (2007) IRPS , pp. 293-305
    • Mavis, D.1    Eaton, P.2
  • 5
    • 49349108830 scopus 로고    scopus 로고
    • S. Rezgui, J.J. Wang, E. Chan Tung, B. Cronquist, and J. McCollum, Comprehensive SEE Characterization of 0.13-μm Flash-Based FPGAs by Heavy-Ion Beam Test, RADECS 07, Deauville, France.
    • S. Rezgui, J.J. Wang, E. Chan Tung, B. Cronquist, and J. McCollum, "Comprehensive SEE Characterization of 0.13-μm Flash-Based FPGAs by Heavy-Ion Beam Test", RADECS 07, Deauville, France.
  • 7
    • 49349104364 scopus 로고    scopus 로고
    • Radiation-Induced Multi-Bit Upsets in SRAM-Based FPGAs
    • Dec
    • H. Quinn, P. Graham. J. Krone, M. Caffrey, and S. Rezgui, "Radiation-Induced Multi-Bit Upsets in SRAM-Based FPGAs", IEEE TNS, Vol. 53, NO. 6, Dec. 2005, pp. 2455-2461.
    • (2005) IEEE TNS , vol.53 , Issue.6 , pp. 2455-2461
    • Quinn, H.1    Graham, P.2    Krone, J.3    Caffrey, M.4    Rezgui, S.5
  • 8
    • 49349109752 scopus 로고    scopus 로고
    • J.J. Wang, RTAX EDAC-RAM Single Event Upset Test Report, Available: http://www.actel.com/documents/RTAX- S%20SEE%20EDAC%20RAM.pdf
    • J.J. Wang, "RTAX EDAC-RAM Single Event Upset Test Report", Available: http://www.actel.com/documents/RTAX- S%20SEE%20EDAC%20RAM.pdf
  • 9
    • 33846387083 scopus 로고    scopus 로고
    • An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays
    • Dec
    • M. Berg, J. J. Wang, R. Ladbury, S. Buchner, H. Kim, J. Howard, K. Label, A. Phan, T. Irwin, and M. Friendlich, "An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays", IEEE TNS, Vol. 53, NO. 6, Dec. 2006, pp 3569-3574.
    • (2006) IEEE TNS , vol.53 , Issue.6 , pp. 3569-3574
    • Berg, M.1    Wang, J.J.2    Ladbury, R.3    Buchner, S.4    Kim, H.5    Howard, J.6    Label, K.7    Phan, A.8    Irwin, T.9    Friendlich, M.10
  • 10
    • 33846322169 scopus 로고    scopus 로고
    • Microdose Induced Dose Data Loss on floating Gate Memories
    • Dec
    • S. Guertin, D. Nguyen, and J. Patterson, "Microdose Induced Dose Data Loss on floating Gate Memories", IEEE TNS, Vol. 53, NO. 6, Dec. 2006, pp 3518-3524.
    • (2006) IEEE TNS , vol.53 , Issue.6 , pp. 3518-3524
    • Guertin, S.1    Nguyen, D.2    Patterson, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.