Depth profiling and angular dependent XPS analysis of ultra thin oxide film on duplex stainless steel

Vacuum

Volumn 84, Issue 11, 2010, Pages 1266-1269

  Donik, Črtomir ^a   Mandrino, Djordje ^a   Jenko, Monika ^a  

^a INSTITUTE OF METALS AND TECHNOLOGY   (Slovenia)

Author keywords

Angular dependent XPS; Depth profile; Oxide layer; Stainless steel

Indexed keywords

AES DEPTH PROFILING; DEPTH PROFILE; DUPLEX STAINLESS STEEL; EMISSION ANGLE; NANO METER RANGE; NON-DESTRUCTIVE TECHNIQUE; OXIDE LAYER; OXIDE LAYER THICKNESS; PEAK INTENSITY RATIO; PROFILING MEASUREMENTS; SAMPLE HOLDERS; SIMPLE METHOD; THICKNESS ESTIMATION; THIN OXIDE LAYERS; ULTRA-THIN OXIDE FILMS; ULTRATHIN LAYERS; XPS; XPS ANALYSIS; XPS MEASUREMENTS;

ANGLE MEASUREMENT; CHROMIUM; CORROSION RESISTANT ALLOYS; DEPTH PROFILING; ESTIMATION; IRON; IRON OXIDES; OXIDE FILMS; OXYGEN; STOICHIOMETRY; THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

STAINLESS STEEL;

EID: 77955708488     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2010.01.057     Document Type: Article

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