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Volumn 39, Issue 5, 2007, Pages 438-444

Oxide and nitride protective layers on stainless steel studied by AES, WDS and XPS

Author keywords

AES; Nitride; Oxide; Stainless steel; WDS; XPS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DEPTH PROFILING; HEAT TREATMENT; PROTECTIVE ATMOSPHERES; SCANNING ELECTRON MICROSCOPY; STAINLESS STEEL; SURFACE MORPHOLOGY;

EID: 34247478661     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2534     Document Type: Article
Times cited : (11)

References (16)
  • 13
    • 0003420793 scopus 로고
    • Hedberg CL ed, Physical Electronics, Inc: Eden Prairie
    • Hedberg CL (ed.). Handbook of Auger Spectroscopy. Physical Electronics, Inc: Eden Prairie, 1995.
    • (1995) Handbook of Auger Spectroscopy
  • 14
    • 33644578537 scopus 로고    scopus 로고
    • Wagner CD, Naumkin AV, Kraut-Vass A, Allison JW, Powell CJ, Rumble JR eds, Online, Available
    • Wagner CD, Naumkin AV, Kraut-Vass A, Allison JW, Powell CJ, Rumble JR (eds.). NIST X-ray Photoelectron Spectroscopy Database. [Online]. Available: http://srdata.nist.gov/xps/ [2005].
    • (2005) NIST X-ray Photoelectron Spectroscopy Database
  • 16
    • 34247545873 scopus 로고    scopus 로고
    • HSC Chemistry for Windows. OutokumpuResearch, Finland, 1999.
    • HSC Chemistry for Windows. OutokumpuResearch, Finland, 1999.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.