The effective susceptibility concept in the electrodynamics of nano-systems

Journal of Computational and Theoretical Nanoscience

Volumn 7, Issue 10, 2010, Pages 2077-2093

  Lozovski, Valeri ^a  

^a TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

Author keywords

Effective susceptibility; Electrodynamics; Low Dimensional system; Nano Particles; Scanning near field optical microscopy; Thin film

Indexed keywords

EFFECTIVE SUSCEPTIBILITY; LOW-DIMENSIONAL SYSTEMS; MESOPARTICLES; NEAR-FIELD IMAGES; NONLINEAR SCANNING; QUANTUM DOT; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SEMI-CONDUCTOR SURFACES; SURFACE PLASMON POLARITONS; SURFACE PLASMONS;

ELECTRODYNAMICS; FILM THICKNESS; NANOPARTICLES; NANOSYSTEMS; OPTICAL DATA STORAGE; OPTICAL FILMS; OPTICAL INSTRUMENTS; PLASMONS; SCANNING; SEMICONDUCTOR QUANTUM DOTS; THIN FILMS; VAPOR DEPOSITION;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 77955690408     PISSN: 15461955     EISSN: None     Source Type: Journal    
DOI: 10.1166/jctn.2010.1588     Document Type: Article

References (73)

1. K. L. Kelly, E. Coronado, L. L. Zhao, and G. C. Schatz, J. Phys. Chem. B 107, 668 (2003).
2. Karl Goser, Peter Glösekötter, and Jan Dienstuhl, Nanoelectronics and Nanosystems: From Transistors to Molecular and Quantum Devices, Springer-Verlag, Berlin, Heidelberg, New York (2004).
3. Jeffrey M. McMahon, Yingmin Wang, Leif J. Sherry, Richard P. Van Duyne, Laurence D. Marks, Stephen K. Gray and George C. Schatz, J. Phys. Chem. C 113, 2731 (2009).
4. T. Feldmann, L. Schneebeli, M. Kira, and S. W. Koch, Phys. Rev. B 73, 155319 (2006).
5. A. Jankovic, R. Ferreira, and G. Bastard, Physics E 21, 252 (2004).
6. Loys Bellegue and Shaul Mukamel, Phys. Rev. B 52, 1936 (1995).
7. Yang Zeng, Ying Fu, Mats Bengtsson, Xiaoshiang, Chen, Wei Lu, and Hans Ågren, Opt. Express 16, 4507 (2008).
8. M. Isaacson, J. A. Cline, and H. Barshatzky, J. Vac. Sci. Technol. B 9, 3103 (1991).
9. Lewis Gomez, Renaud Bachelot, Alexandre Bouhelier, Gary Wiederrecht, Shin-Hui Chang, Stephen K. Gray, Feng Hua, Seokwoo Jeon, John A. Rogers, Miguel E. Kastro, Sylvain Blaize, Ilan Stefanon, Gilles Lerondel, and Pascal Royel, JOSA B 23, 823 (2006).
10. R. Wannemacher, M. Quinten, and A. Pack, J. of Microscopy 194, 260 (1999).
11. A. D. Zamkovets, S. M. Kachan, A. N. Ponyavina, and N. I. Sil'vanovich, J. of Appl. Spectrosc. 70, 593 (2003).
12. Robyn Wangberg, Justin Elser, Evgenii E. Narimanov, and Viktor A. Podolskiy, JOSA B 23, 498 (2006).
13. Andrey K. Sarychev and Vladimir M. Shalaev, Electrodynamics of Metamaterials, World Scientific, Singapore (2007).
14. O. Keller, J. Opt. Soc. Am. B 12, 997 (1995).
15. Y. Chen, Nuovo Cimento D 11, 993 (1989).
16. G. Crajkowski and A. Tredicucci, Nuovo Cimento D 14, 1203 (1992).
17. F. Thiele, Ch. Fuchs, and R. V. Baltz, Phys. Rev. B 64, 205309 (2001).
18. G. Ya. Slepyan, S. A. Maksimenko, A. V. Magyarov, A. Hoffmann, and D. Bimberg, Superlattices Microstruct. 36, 773 (2004).
19. Loys Bellegue and Shaul Mukamel, J. Chem. Phys. 101, 9719 (1994).
20. Ole Keller, Phys. Rep. 268, 85 (1996).
21. J.-J. Greffet and R. Carminati, Prog. Surf. Sci. 56, 113 (1998).
22. Christian Girard, Christian Joachim, and Sebastien Gauthier, Rep. Progr. Phys. 63, 893 (2000).
23. Christian Girard, Rep. Progr. Phys. 68, 1883 (2005).
24. S. Kirkpatrick, Rev. of Mod. Phys. 45, 574 (1973).
25. Tuck C. Choy, Effective Medium Theory: Principles and Applications, Oxford University Press, Oxford (1999).
26. Aleksandr J. Stoyanov, Eugene C. Fisher, and Herbert Überall, J. Appl. Phys. 89, 4486 (2001).
27. A. V. Goncharenko, V. Z. Lozovski, and E. F. Venger, J. Phys.: Condens. Mater. 13, 8217 (2001).
28. John David Jackson, Classical Electrodynamics, John Wiley & Sons, New York (1998).
29. Max Born and Emil Wolf, Principles of Optics, Pergamon Press, Oxford (1968).
30. Philip M. Morse and Herman Feshbach, Methods of Theoretical Physics Part II, McGrow Hill Book Co., New York, Toronto, London (1953), Chaps. 9-13
31. R. Kurant and D. G. D. Gilbert, Methods of Mathematical Physics, Wiley, New York (1962).
32. J. Mathews and R. L. Walker, Mathematical Methods of Physics, edited by W. A. Benjzmin, Jon Methews and Robert L. Walker, Wiley & Sons, New York (1970).
33. Sotoshi Kawata, Motoishi Ohtsu, and Masahiro Irie (eds.), NanoOptics, Springer (2002).
34. Siegfried Flügge, Practical Quantum Mechanics II, Springer (1971).
35. O. Keller and T. Garm, Phys. Rev. B 52, 4670 (1995).
36. O. Keller, M. Xiao, and S. Bozhevolnyi, Opt. Commun. 114, 491 (1995).
37. V. Lozovski, Physica E 19, 263 (2003).
38. O. Keller, JOSA B 11, 1480 (1994).
39. V. Lozovski, Opt. Specroscop. 86, 96 (1999).
40. I. Iezhokin, O. Keller, and V. Lozovski, J. Comp. Theor. Nanosci. 1, 1 (2010).
41. T. R. Yang, M. M. Dvoynenko, A. V. Goncharenko, and V. Z. Lozovski, Am. J. Phys. 71, 64 (2003).
42. J. Homola and M. Piliarik, Surface Plasmon Resonance Based Sensors, edited by J. Homola, Springer-Verlag, Berlin, Heidelberg (2006), p. 45
43. V. Chegel, Yu. Chegel, M. D. Guiver, A. Lopatynskyi, O. Lopatynska, and V. Lozovski, Sensors and Actuators B: Chemical 134, 66 (2008).
44. A. B. Evlyukhin and S. I. Bozhevolnyi, Phys. Rev. B 71, 134304 (2005).
45. A. B. Evlyukhin, G. Brukoli, L. Martin-Moreno, S. I. Bozhevolnyi, and F. J. Garsia-Vidal, Phys. Rev. B 76, 075426 (2007).
46. V. Chegel, Yu. Demidenko, V. Lozovski, and A. Tsykhonya, Surf. Sci. 602, 1540 (2008).
47. Bernard M. de Dormale, Canadien J. of Phys. 74, 43 (1996).
48. J. Van Bladel, IRE Trans. Antennas Propagai AP-9, 563 (1961).
49. A. D. Jaghjaian, Proc. IEEE 68, 248 (1980).
50. A. Liu and G. W. Bryant, Phys. Rev. B 59, 2245 (1999).
51. Z.-Y. Li, B.-J. Gu, and G.-Z. Yang, Phys. Rev. B 59, 12622 (1999).
52. Sylvie Roke, Misha Bonn, and Andrei V. Petukhov, Phys. Rev. B 70, 115106(2004).
53. S. Bozhevolnyi and A. Evliukhin, Surf. Sci. 590, 173 (2005).
54. L. Landau and E. Lifshitz, Electrodynamics of Continuous Media, Pergamon, London (1960).
55. V. Chegel, Yu. Demidenko, V. Lozovski, and A. Tsikhonya, Surf. Sci. 602, 1540 (2008).
56. E. Bortchagovsky, V. Lozovski, and T. Mishakova, Ukr. J. of Phys. 55 (2010) to be published.
57. S. Khihlovski, V. Lozovski, and G. Strilchuk, J. of Comput. and Theor. Nanosci. 6, 667 (2009).
58. K. P. Gritsenko, A. Capobianchi, A. Convertino, J. Friedrich, R. D. Shulze, V. Ksensov, and S. Shrader, Polymer Surface Modification and Polymer Coatings by Dry Process Technologies, edited by S. Iwamori, Research Signpost, Kerala, India (2005), pp. 85-109.
59. Sergey I. Bozhevolnyi and Valeri Z. Lozovski, Phys. Rev. B 65, 235420 (2000).
60. Valeri Z. Lozovski, Jonas Beermenn, and Sergey I. Bozhevolnyi, Phys. Rev. B 75, 045438 (2007).
61. Yuvival Garini, Bart J. Vermolen, and Ian T. Young, Curr. Opin. Biotechnol. 16, 3 (2005).
62. Bert Hecht, Beate Sick, Urs P. Wild, Volker Decken, Renato Zenobi, Oliver J. F. Martin, and Dieter W. Pohl, J. Chem. Phys. 112, 7761 (2000).
63. Sergey I. Bozhevolnyi and Valeri Z. Lozovski, Phys. Rev. B 61, 11139(2000).
64. V. Lozovski, Yu. Nazarok, and S. I. Bozhevolnyi, Physica E 11, 323 (2001).
65. Jörg P. Kottmann and Oliver J. F. Martin, David R. Smith, and Sheldon Schultz, Phys. Rev. B 64, 235402 (2001).
66. V. Z. Lozovski, G. G. Tarasov, and V. O. Vasilenko, Opt. Spectroscop. 103, 925 (2007).
67. V. Lozovski, V. Vasilenko, G. Tarasov, Yu. Mazur, and G. Salamo, JOSA B 24, 1542(2007).
68. A. Richter, G. Behme, M. Süptitz, Ch. Lienau, T. Elsaesser, M. Ramsteiner, R. Nötzel, and K. H. Ploog, Phys. Rev. Lett. 19, 2145 (1997).
69. V. Emiliani, T. Guenther, Ch. Lienau, R. Nötzel, and K. H. Ploog, J. Microsc. 202, 229 (2001).
70. E. Kasper, Properties of Strained and Relaxed Silicon Germanium, INSPEC, London (1995).
71. F. Schaffer, Properties of Advanced Semiconductor Materials GaN, AlN, InN, BN, SiC, SiGe, edited by M. E. Levinstein, S. L. Rumyantsev, and M. S. Shur, John Wiley and Sons, NY (2001), pp. 149-188.
72. V. Z. Lozovski and V. O. Vasilenko, Opt. Commun. 281, 3932 (2008).
73. V. Lozovski and A. Tsykhonya, Internal J. Theor. Phys. Group Theor. Nonlinear Optics 12, 31 (2007).