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Volumn 61, Issue 16, 2000, Pages 11139-11150
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Self-consistent model for second-harmonic near-field microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001180951
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.61.11139 Document Type: Article |
Times cited : (42)
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References (27)
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