Shelf-life time test of p- and n-channel organic thin film transistors using copper phthalocyanines

Thin Solid Films

Volumn 518, Issue 19, 2010, Pages 5593-5598

  Nénon, Sébastien ^a   Kanehira, Daiki ^b   Yoshimoto, Noriyuki ^b   Fages, Frédéric ^a   Videlot Ackermann, Christine ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b IWATE UNIVERSITY   (Japan)

Author keywords

Atomic force miscoscopy; Charge carrier mobility; Copper phthalocyanine; Fluorinated copper phthalocyanine; Morphology; Organic semiconductor; Stability; Thin film transistor; Thin films; X ray diffraction

Indexed keywords

ATOMIC FORCE; CHARGE-CARRIER MOBILITY; COPPER PHTHALOCYANINE; FLUORINATED COPPER PHTHALOCYANINE; ORGANIC SEMICONDUCTOR;

ATOMIC FORCE MICROSCOPY; ATOMS; CARRIER MOBILITY; COPPER; DIFFRACTION; DRAIN CURRENT; FIELD EFFECT TRANSISTORS; MORPHOLOGY; NITROGEN COMPOUNDS; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

THIN FILM TRANSISTORS;

EID: 77955660173     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.04.035     Document Type: Article

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