-
2
-
-
0036923301
-
-
Digest of Electron Devices Meeting 2002 (IEDM '02), p.
-
W. W. Zhuang, W. Pan, B. D. Ulrich, J. J. Lee, L. Stecker, A. Burmaster, D. R. Evans, S. T. Tajiri, M. Hsu, A. Shimaoka, K. Inoue, T. Naka, N. Awaya, A. Sakiyama, Y. Wang, S. Q. Liu, N. J. Wu, and A. Ignatiev, Digest of Electron Devices Meeting 2002 (IEDM '02), p. 193.
-
-
-
Zhuang, W.W.1
Pan, W.2
Ulrich, B.D.3
Lee, J.J.4
Stecker, L.5
Burmaster, A.6
Evans, D.R.7
Tajiri, S.T.8
Hsu, M.9
Shimaoka, A.10
Inoue, K.11
Naka, T.12
Awaya, N.13
Sakiyama, A.14
Wang, Y.15
Liu, S.Q.16
Wu, N.J.17
Ignatiev, A.18
-
3
-
-
0001331485
-
-
10.1063/1.126902
-
A. Beck, J. G. Bednorz, Ch. Gerber, C. Rossel, and D. Widmer, Appl. Phys. Lett. 77, 139 (2000). 10.1063/1.126902
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 139
-
-
Beck, A.1
Bednorz, J.G.2
Gerber, Ch.3
Rossel, C.4
Widmer, D.5
-
4
-
-
64249168806
-
-
10.1126/science.1168636
-
T. Choi, S. Lee, Y. J. Choi, V. Kiryukhin, and S.-W. Cheong, Science 324, 63 (2009). 10.1126/science.1168636
-
(2009)
Science
, vol.324
, pp. 63
-
-
Choi, T.1
Lee, S.2
Choi, Y.J.3
Kiryukhin, V.4
Cheong, S.-W.5
-
6
-
-
0042378349
-
-
10.1063/1.1590741
-
A. Baikalov, Y. Q. Wang, B. Shen, B. Lorenz, S. Tsui, Y. Y. Sun, Y. Y. Xue, and C. W. Chu, Appl. Phys. Lett. 83, 957 (2003). 10.1063/1.1590741
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 957
-
-
Baikalov, A.1
Wang, Y.Q.2
Shen, B.3
Lorenz, B.4
Tsui, S.5
Sun, Y.Y.6
Xue, Y.Y.7
Chu, C.W.8
-
7
-
-
43049134909
-
-
10.1080/00150190701261031
-
Y. Watanabe, Ferroelectrics 349, 190 (2007). 10.1080/00150190701261031
-
(2007)
Ferroelectrics
, vol.349
, pp. 190
-
-
Watanabe, Y.1
-
8
-
-
0035806023
-
-
10.1063/1.1377617
-
Y. Watanabe, J. G. Bednorz, A. Bietsch, Ch. Gerber, D. Widmer, A. Beck, and S. J. Wind, Appl. Phys. Lett. 78, 3738 (2001). 10.1063/1.1377617
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 3738
-
-
Watanabe, Y.1
Bednorz, J.G.2
Bietsch, A.3
Gerber, Ch.4
Widmer, D.5
Beck, A.6
Wind, S.J.7
-
9
-
-
34548656097
-
-
10.1002/adma.200602915
-
M. Janousch, G. I. Meijer, U. Staub, B. Delley, S. F. Karg, and B. P. Andreasson, Adv. Mater. 19, 2232 (2007). 10.1002/adma.200602915
-
(2007)
Adv. Mater.
, vol.19
, pp. 2232
-
-
Janousch, M.1
Meijer, G.I.2
Staub, U.3
Delley, B.4
Karg, S.F.5
Andreasson, B.P.6
-
10
-
-
33745386456
-
-
10.1103/PhysRevB.73.245427
-
D. S. Shang, Q. Wang, L. D. Chen, R. Dong, X. M. Li, and W. Q. Zhang, Phys. Rev. B 73, 245427 (2006). 10.1103/PhysRevB.73.245427
-
(2006)
Phys. Rev. B
, vol.73
, pp. 245427
-
-
Shang, D.S.1
Wang, Q.2
Chen, L.D.3
Dong, R.4
Li, X.M.5
Zhang, W.Q.6
-
11
-
-
47549093344
-
-
10.1063/1.2959059
-
F. La Mattina, J. G. Bednorz, S. F. Alvarado, A. Shengelaya, and H. Keller, Appl. Phys. Lett. 93, 022102 (2008). 10.1063/1.2959059
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 022102
-
-
La Mattina, F.1
Bednorz, J.G.2
Alvarado, S.F.3
Shengelaya, A.4
Keller, H.5
-
13
-
-
84860077655
-
-
10.1103/PhysRevB.70.224403
-
A. Odagawa, H. Sato, I. H. Inoue, H. Akoh, M. Kawasaki, Y. Tokura, T. Kanno, and H. Adachi, Phys. Rev. B 70, 224403 (2004). 10.1103/PhysRevB.70.224403
-
(2004)
Phys. Rev. B
, vol.70
, pp. 224403
-
-
Odagawa, A.1
Sato, H.2
Inoue, I.H.3
Akoh, H.4
Kawasaki, M.5
Tokura, Y.6
Kanno, T.7
Adachi, H.8
-
14
-
-
56649108011
-
-
10.1016/j.mee.2008.09.021
-
M. Y. Chan, T. Zhang, V. Ho, and P. S. Lee, Microelectron. Eng. 85, 2420 (2008). 10.1016/j.mee.2008.09.021
-
(2008)
Microelectron. Eng.
, vol.85
, pp. 2420
-
-
Chan, M.Y.1
Zhang, T.2
Ho, V.3
Lee, P.S.4
-
15
-
-
0000876444
-
-
10.1103/PhysRevB.59.11257
-
Y. Watanabe, Phys. Rev. B 59, 11257 (1999). 10.1103/PhysRevB.59.11257
-
(1999)
Phys. Rev. B
, vol.59
, pp. 11257
-
-
Watanabe, Y.1
-
17
-
-
38149002136
-
-
10.1016/j.physleta.2007.08.045
-
N. A. Tulina and I. Y. Borisenko, Phys. Lett. A 372, 918 (2008). 10.1016/j.physleta.2007.08.045
-
(2008)
Phys. Lett. A
, vol.372
, pp. 918
-
-
Tulina, N.A.1
Borisenko, I.Y.2
-
18
-
-
33747498419
-
-
10.1063/1.2335802
-
S. Karg, G. I. Meijer, D. Widmer, and J. G. Bednorz, Appl. Phys. Lett. 89, 072106 (2006). 10.1063/1.2335802
-
(2006)
Appl. Phys. Lett.
, vol.89
, pp. 072106
-
-
Karg, S.1
Meijer, G.I.2
Widmer, D.3
Bednorz, J.G.4
-
19
-
-
51749113092
-
-
10.1063/1.2978240
-
D. S. Shang, J. R. Sun, L. Shi, and B. G. Shen, Appl. Phys. Lett. 93, 102106 (2008). 10.1063/1.2978240
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 102106
-
-
Shang, D.S.1
Sun, J.R.2
Shi, L.3
Shen, B.G.4
-
20
-
-
34547842595
-
-
10.1063/1.2760156
-
W. Guan, S. Long, R. Jia, and M. Liu, Appl. Phys. Lett. 91, 062111 (2007). 10.1063/1.2760156
-
(2007)
Appl. Phys. Lett.
, vol.91
, pp. 062111
-
-
Guan, W.1
Long, S.2
Jia, R.3
Liu, M.4
-
22
-
-
33846257227
-
-
10.1063/1.2430912
-
Y. Xia, W. He, L. Chen, X. Meng, and Z. Liu, Appl. Phys. Lett. 90, 022907 (2007). 10.1063/1.2430912
-
(2007)
Appl. Phys. Lett.
, vol.90
, pp. 022907
-
-
Xia, Y.1
He, W.2
Chen, L.3
Meng, X.4
Liu, Z.5
-
23
-
-
33846258087
-
-
10.1063/1.2431438
-
X. F. Liang, Y. Chen, L. Chen, J. Yin, and Z. G. Liu, Appl. Phys. Lett. 90, 022508 (2007). 10.1063/1.2431438
-
(2007)
Appl. Phys. Lett.
, vol.90
, pp. 022508
-
-
Liang, X.F.1
Chen, Y.2
Chen, L.3
Yin, J.4
Liu, Z.G.5
-
24
-
-
75449100527
-
-
10.1080/00150190802384294
-
S. Kaku, S. Miyauchi, T. Arai, and Y. Watanabe, Ferroelectrics 370, 39 (2008). 10.1080/00150190802384294
-
(2008)
Ferroelectrics
, vol.370
, pp. 39
-
-
Kaku, S.1
Miyauchi, S.2
Arai, T.3
Watanabe, Y.4
-
25
-
-
0037986483
-
-
10.1063/1.1566089
-
R. Bouregba, G. Pullain, B. Vilquin, and G. Le Rhun, J. Appl. Phys. 93, 5583 (2003). 10.1063/1.1566089
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 5583
-
-
Bouregba, R.1
Pullain, G.2
Vilquin, B.3
Le Rhun, G.4
-
26
-
-
0010340486
-
-
10.1016/0038-1101(61)90034-X
-
G. T. Wright, Solid-State Electron. 2, 165 (1961). 10.1016/0038-1101(61) 90034-X
-
(1961)
Solid-State Electron.
, vol.2
, pp. 165
-
-
Wright, G.T.1
-
27
-
-
0020826474
-
-
10.1063/1.332748
-
L. D. Partain, J. Appl. Phys. 54, 5218 (1983). 10.1063/1.332748
-
(1983)
J. Appl. Phys.
, vol.54
, pp. 5218
-
-
Partain, L.D.1
-
28
-
-
0010389496
-
-
10.1103/PhysRev.74.1505
-
H. Y. Fan, Phys. Rev. 74, 1505 (1948). 10.1103/PhysRev.74.1505
-
(1948)
Phys. Rev.
, vol.74
, pp. 1505
-
-
Fan, H.Y.1
-
33
-
-
0038759725
-
-
10.1063/1.107125
-
L.-W. Yin, J. P. Ibbetson, M. M. Hashemi, A. C. Gossard, U. K. Mishra, Y. Hwang, T. Zhang, and R. M. Kolbas, Appl. Phys. Lett. 60, 2005 (1992). 10.1063/1.107125
-
(1992)
Appl. Phys. Lett.
, vol.60
, pp. 2005
-
-
Yin, L.-W.1
Ibbetson, J.P.2
Hashemi, M.M.3
Gossard, A.C.4
Mishra, U.K.5
Hwang, Y.6
Zhang, T.7
Kolbas, R.M.8
-
34
-
-
34347324008
-
-
10.1103/PhysRevB.75.205322
-
F. Neumann, Y. A. Genenko, C. Melzer, S. V. Yampolskii, and H. von Seggern, Phys. Rev. B 75, 205322 (2007). 10.1103/PhysRevB.75.205322
-
(2007)
Phys. Rev. B
, vol.75
, pp. 205322
-
-
Neumann, F.1
Genenko, Y.A.2
Melzer, C.3
Yampolskii, S.V.4
Von Seggern, H.5
-
36
-
-
0001645380
-
-
10.1063/1.1327286
-
E. Tutiš, M. Bussac, B. Masenelli, M. Carrard, and L. Zuppiroli, J. Appl. Phys. 89, 430 (2001). 10.1063/1.1327286
-
(2001)
J. Appl. Phys.
, vol.89
, pp. 430
-
-
Tutiš, E.1
Bussac, M.2
Masenelli, B.3
Carrard, M.4
Zuppiroli, L.5
-
37
-
-
34247253381
-
-
10.1063/1.2721382
-
W. Chandra, L. K. Ang, K. L. Pey, and C. M. Ng, Appl. Phys. Lett. 90, 153505 (2007). 10.1063/1.2721382
-
(2007)
Appl. Phys. Lett.
, vol.90
, pp. 153505
-
-
Chandra, W.1
Ang, L.K.2
Pey, K.L.3
Ng, C.M.4
-
38
-
-
0344547272
-
-
10.1063/1.1708004
-
M.-A. Nicolet, J. Appl. Phys. 37, 4224 (1966). 10.1063/1.1708004
-
(1966)
J. Appl. Phys.
, vol.37
, pp. 4224
-
-
Nicolet, M.-A.1
-
39
-
-
0018505255
-
-
10.1063/1.326639
-
Y. K. Sharma, J. Appl. Phys. 50, 5381 (1979). 10.1063/1.326639
-
(1979)
J. Appl. Phys.
, vol.50
, pp. 5381
-
-
Sharma, Y.K.1
-
41
-
-
0014700753
-
-
10.1063/1.1658336
-
J. Sworakowski, J. Appl. Phys. 41, 292 (1970). 10.1063/1.1658336
-
(1970)
J. Appl. Phys.
, vol.41
, pp. 292
-
-
Sworakowski, J.1
-
43
-
-
0028375764
-
-
10.1016/0040-6090(94)90069-8
-
G. W. Ba̧k and A. Lipiński, Thin Solid Films 238, 290 (1994). 10.1016/0040-6090(94)90069-8
-
(1994)
Thin Solid Films
, vol.238
, pp. 290
-
-
Ba̧k, G.W.1
Lipiński, A.2
-
48
-
-
84951242634
-
-
Proceedings of the Eighth Annual Reliability Physics Symposium, Las Vegas, Nevada, USA, IEEE, New York
-
R. H. Walden and R. J. Strain, Proceedings of the Eighth Annual Reliability Physics Symposium, Las Vegas, Nevada, USA, 1970 (IEEE, New York, 1971), p. 23.
-
(1970)
, pp. 23
-
-
Walden, R.H.1
Strain, R.J.2
-
51
-
-
34047113572
-
-
10.1016/j.physb.2007.01.008
-
M. Ahrens, R. Merkle, B. Rahmati, and J. Maier, Physica B 393, 239 (2007). 10.1016/j.physb.2007.01.008
-
(2007)
Physica B
, vol.393
, pp. 239
-
-
Ahrens, M.1
Merkle, R.2
Rahmati, B.3
Maier, J.4
-
53
-
-
0030286953
-
-
10.1143/JJAP.35.5745
-
Y. Watanabe, Y. Matsumoto, and M. Tanamura, Jpn. J. Appl. Phys., Part 1 35, 5745 (1996). 10.1143/JJAP.35.5745
-
(1996)
Jpn. J. Appl. Phys., Part 1
, vol.35
, pp. 5745
-
-
Watanabe, Y.1
Matsumoto, Y.2
Tanamura, M.3
-
55
-
-
68949129451
-
-
10.1103/PhysRevB.80.035105
-
J. Son and S. Stemmer, Phys. Rev. B 80, 035105 (2009). 10.1103/PhysRevB.80.035105
-
(2009)
Phys. Rev. B
, vol.80
, pp. 035105
-
-
Son, J.1
Stemmer, S.2
-
56
-
-
34247495642
-
-
10.1038/nnano.2006.55
-
R. J. Tseng, C. Tsai, L. Ma, J. Ouyang, C. S. Ozkan, and Y. Yang, Nat. Nanotechnol. 1, 72 (2006). 10.1038/nnano.2006.55
-
(2006)
Nat. Nanotechnol.
, vol.1
, pp. 72
-
-
Tseng, R.J.1
Tsai, C.2
Ma, L.3
Ouyang, J.4
Ozkan, C.S.5
Yang, Y.6
-
59
-
-
77955609515
-
-
10.1143/JPSJ.78.104712;
-
Y. Watanabe, J. Phys. Soc. Jpn. 78, 104712 (2009) 10.1143/JPSJ.78.104712
-
(2009)
J. Phys. Soc. Jpn.
, vol.78
, pp. 104712
-
-
Watanabe, Y.1
-
60
-
-
77955606649
-
-
Y. Watanabe, Bull. Am. Phys. Soc. 54 (1), 1053 (2009) (March Meeting 2009 Z10-3).
-
(2009)
Bull. Am. Phys. Soc.
, vol.54
, Issue.1
, pp. 1053
-
-
Watanabe, Y.1
|