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Volumn 295, Issue 1-2, 2010, Pages 60-64

A combined single photon ionization and photoelectron ionization source for orthogonal acceleration time-of-flight mass spectrometer

Author keywords

Combined ion source; Photoelectron ionization; Single photon ionization; VUV lamp

Indexed keywords


EID: 77955584833     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2010.06.034     Document Type: Article
Times cited : (38)

References (33)
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