Orthogonal electron impact source for a time-of-flight mass spectrometer with high mass resolving power

International Journal of Mass Spectrometry

Volumn 185, Issue , 1999, Pages 221-226

  Chen, Y H ^a   Gonin, M ^b   Fuhrer, K ^b   Dodonov, A ^c   Su, C S ^a   Wollnik, H ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b JUSTUS LIEBIG UNIVERSITY   (Germany)

^c INSTITUTE OF PROBLEMS OF CHEMICAL PHYSICS   (Russian Federation)

Author keywords

Electron impact; Ion source; Time of flight mass spectrometer

Indexed keywords

EID: 0005142050     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1387-3806(98)14152-0     Document Type: Article

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