Photoelectron emission as an alternative electron impact ionization source for ion trap mass spectrometry

Analytical Chemistry

Volumn 80, Issue 17, 2008, Pages 6791-6795

  Gamez, Gerardo ^a   Zhu, Liang ^a   Schmitz, Thomas A ^a   Zenobi, Renato ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; COMPUTER NETWORKS; ELECTROLYSIS; ELECTROMAGNETIC WAVES; ELECTRONS; EMISSION SPECTROSCOPY; FILAMENTS (LAMP); HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; INERT GASES; IONIZATION; IONIZATION POTENTIAL; IONS; KRYPTON; MASS SPECTROMETERS; MASS SPECTROMETRY; PHOTOELECTRON SPECTROSCOPY; PHOTONS; SPECTROMETERS; SPECTROMETRY;

ELECTRON-IMPACT IONIZATION; ION TRAPPING;

IMPACT IONIZATION;

KRYPTON;

ARTICLE; ELECTRON IMPACT IONIZATION; FIELD EMISSION; FRAGMENTATION REACTION; ION TRAP MASS SPECTROMETRY; IONIZATION; MASS SPECTROMETRY; PHOTOELECTRON EMISSION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 51549091218     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac8007187     Document Type: Article

References (28)

1. Gao, L.; Song, Q. Y.; Noll, R. J.; Duncan, J.; Cooks, R. G.; Zheng, O. Y. J. Mass. Spectrom. 2007, 42, 675-680.
2. Gao, L.; Song, Q. Y.; Patterson, G. E.; Cooks, R. G.; Ouyang, Z. Anal. Chem. 2006, 78, 5994-6002.
3. Setz, P. D.; Schmitz, T. A.; Zenobi, R. Rev. Sci. Instrum. 2006, 77.
4. Schmitz, T. A.; Gamez, G.; Setz, P. D.; Zhu, L.; Zenobi, R. Anal. Chem. DOI: 10.1021/ac8005044.
5. Rohwer, E. R.; Beavis, R. C.; Koster, C.; Lindner, J.; Grotemeyer, J.; Schlag, E. W. Z. Naturforsch., A: Phys. Sci. 1988, 43, 1151-1153.
6. Boyle, J. G.; Pfefferte, L. D.; Gulcicek, E. E.; Colson, S. D. Rev. Sci. Instrum. 1991, 62, 323-333.
7. Cheng, P. Y.; Dai, H. L. Rev. Sci. Instrum. 1993, 64, 2211-2214.
8. Moritz, F.; Dey, M.; Zipperer, K.; Prinke, S.; Grotemeyer, J. Org. Mass Spectrom. 1993, 28, 1467-1475.
9. Colby, S. M.; Reilly, J. P. Int. J. Mass Spectrom 1994, 131, 125-138.
10. Schriemer, D. C.; Li, L. Rev. Sci. Instrum. 1995, 66, 55-62.
11. Schriemer, D. C.; Li, L. Anal. Chem. 1996, 68, 250-256.
12. Wang, L.; Li, H. Y.; Bai, J. L.; Hua, X. Q.; Lu, R. C. Int. J. Mass Spectrom 1998, 181, 43-50.
13. Muhlberger, F.; Zimmermann, R.; Kettrup, A. Anal. Chem. 2001, 73, 3590-3604.
14. Boesl, U.; Bassmann, C.; Drechsler, G.; Distelrath, V. Eur. Mass Spectrom. 1999, 5, 455-470.
15. LaFranchi, B. W.; Petrucci, G. A. J. Am. Soc. Mass Spectrom. 2004, 15, 424-430.
16. LaFranchi, B. W.; Zahardis, J.; Petrucci, G. A. Rapid Commun. Mass Spectrom. 2004, 18, 2517-2521.
17. Lovelock, J. E. Anal. Chem. 1961, 33, 162-&
18. Lovelock, J. E.; Shoemake, G. R.; Zlatkis, A. Anal. Chem. 1963, 35, 460-&
19. Inman, E. L.; Voigtman, E.; Winefordner, J. D. Appl. Spectrosc. 1982, 36, 99-102.
20. Guzowski, J. P.; Broekaert, J. A. C.; Ray, S. J.; Hieftje, G. M. J. Anal. At. Spectrom. 1999, 14, 1121-1127.
21. Kanno, N.; Tonokura, K. Appl. Spectrosc. 2007, 61, 896-902.
22. Tadashi, A.; Satoshi, O.; Yoshihiro, T.; Shigeki, M. J. Mass Spectrom. Soc. Jpn. 2006, 54, 243-249.
23. http://webbook.nist.gov/chemistry/.
24. Lifshitz, C. Int. J. Mass. Spectrom 1991, 106, 159-173.
25. Ohmichi, N.; Gotkis, I.; Steens, L.; Lifshitz, C. Org. Mass. Spectrom. 1992, 27, 383-389.
26. Lotz, W. Z. Phys. 1967, 206, 205-&
27. Sorokin, A. A.; Shmaenok, L. A.; Bobashev, S. V.; Mobus, B.; Richter, H.; Ulm, G. Phys. Rev. A 2000, 61.
28. http://physics.nist.gov/PhysRefData/Ionization/Xsection.html.