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Volumn 74, Issue 15, 2002, Pages 3790-3801

Single photon ionization (SPI) via incoherent VUV-excimer light: Robust and compact time-of-flight mass spectrometer for on-line, real-time process gas analysis

(4) Muhlberger F a Wieser, J b Ulrich, A c Zimmermann, R a,d,e

a INSTITUTE OF EPIDEMIOLOGY (Germany)

b GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH (Germany)

c TECHNICAL UNIVERSITY OF MUNICH (Germany)

d UNIVERSITY OF AUGSBURG (Germany)

e BIfA Bayerisches Institut für Angewandte Umweltforschung und technik GmbH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEUTERIUM; ELECTRIC LAMPS; EXCIMER LASERS; INERT GASES; IONIZATION; LIGHT SOURCES; MASS SPECTROMETRY; MIXTURES; ROBUSTNESS (CONTROL SYSTEMS); ULTRAVIOLET RADIATION;

GAS ANALYSIS;

ORGANIC COMPOUNDS;

ALIPHATIC COMPOUND; AROMATIC COMPOUND; ORGANIC COMPOUND;

ANALYTIC METHOD; ARTICLE; DENSITY; ELECTRON BEAM; ENVIRONMENT; EXCIMER LASER; EXHAUST GAS; GAS ANALYSIS; IONIZATION; MASS SPECTROMETRY; MEASUREMENT; MOTORCYCLE; NEODYMIUM LASER; ONLINE MONITORING; SINGLE PHOTON IONIZATION MASS SPECTROMETRY; TECHNIQUE; TECHNOLOGY; ULTRAVIOLET RADIATION; VACUUM;

EID: 0036683088 PISSN: 00032700 EISSN: None Source Type: Journal
DOI: 10.1021/ac0200825 Document Type: Article

Times cited : (111)

References (46)

1
- 0028410213
- (1994) Anal. Chem. , vol.66 , pp. 1062-1069
- Weickhardt, C.¹ Boesl, U.² Schlag, E.W.³

2
- 0033555387
- (1999) Anal. Chem. , vol.71 , pp. 489-496
- Butcher, D.J.¹ Goeringer, D.E.² Hurst, G.B.³

3
- 0035417207
- (2001) Anal. Chem. , vol.73 , pp. 3590-3604
- Mühlberger, F.¹ Zimmermann, R.² Kettrup, A.³

4
- 0030742556
- (1997) Rapid Commun. Mass Spectrom. , vol.11 , pp. 1095-1102
- Zimmermann, R.¹ Heger, H.J.² Kettrup, A.³ Boesl, U.⁴

5
- 0032929921
- (1999) Anal. Chem. , vol.71 , pp. 46-57
- Heger, H.J.¹ Zimmermann, R.² Dorfner, R.³ Beckmann, M.⁴ Griebel, H.⁵ Kettrup, A.⁶ Boesl, U.⁷

6
- 2742563110
- (1998) Eur. Mass Spectrom. , vol.4 , pp. 215-222
- Thanner, R.¹ Oser, H.² Grotheer, H.-H.³

7
- 0035866614
- (2001) Environ. Sci. Technol. , vol.35 , pp. 1019-1030
- Zimmermann, R.¹ Blumenstock, M.² Heger, H.J.³ Schramm, K.-W.⁴ Kettrup, A.⁵

8
- 0001283708
- (2001) Organohalogen Compd. , vol.54 , pp. 380-383
- Yamada, M.¹ Hashimoto, Y.² Suga, M.³ Waki, I.⁴ Sakairi, M.⁵ Hori, Y.⁶ Sakamoto, M.⁷

9
- 0034669175
- (2000) Anal. Chem. , vol.72 , pp. 5639
- Garnica, R.M.¹ Appel, M.F.² Eagan, L.³ McKeachie⁴ Benter, T.⁵

10
- 10044271359
- (1998) Int. J. Mass Spectrom. Ion Processes , vol.173 , pp. 191-241
- Lindinger, W.¹ Hansel, A.² Jordan, A.³

11
- 0030478834
- (1996) Rapid Commun. Mass Spectrom. , vol.10 , pp. 1975-1979
- Zimmermann, R.¹ Heger, H.J.² Yeretzian, C.³ Nagel, H.⁴ Boesl, U.⁵

12
- 0001819991
- Helsinki, Finland August 2-6 1999; ASIC Publication: Paris, France, March
- (2000) Asic '99 , pp. 136-142
- Dorfner, R.¹ Yeretzian, C.² Zimmermann, R.³ Kettrup, A.⁴

13
- 0001192962
- (1978) Z. Naturforsch. , vol.33 A , pp. 1546-1548
- Boesl, U.¹ Neusser, H.J.² Schlag, E.W.³

14
- 33845279304
- (1988) Anal. Chem. , vol.60 , pp. 5-10
- Hager, J.W.¹ Wallace, S.C.²

15
- 0000293041
- (1994) Combust. Sci. Technol. , vol.101 , pp. 333-348
- Tanada, T.N.¹ Velazquez, J.² Hemmi, N.³ Cool, T.A.⁴

16
- 0021501040
- (1984) Anal. Chem. , vol.56 , pp. 1962-1967
- Tembreull, R.¹ Lubman, D.M.²

17
- 0001647109
- (1982) J. Chem. Phys. , vol.76 , Issue.8 , pp. 3967-3973
- Miller, J.C.¹ Compton, R.N.²

18
- 0000274876
- (1990) J. Am. Soc. Mass Spectrom. , vol.1 , pp. 419-426
- Van Bramer, S.E.¹ Johnston, M.V.²

19
- 0033134727
- (1999) Anal. Chem. , vol.71 , pp. 1674-1678
- Nir, E.¹ Hunziker, H.E.² Vries, M.S.³

20
- 0024639982
- (1989) Anal. Chem. , vol.61 , pp. 805-811
- Pallix, J.B.¹ Schühle, U.² Becker, C.H.³ Huestis, D.L.⁴

21
- 0000157698
- (1999) Microchem. J. , vol.62 , pp. 354-362
- Butcher, D.J.¹

22
- 0002101945
- Mollenauer, L. F., White, J. C., Eds.: Springer-Verlag: Berlin
- (1987) Tunable Lasers , vol.59 , pp. 56-113
- Vidal, C.R.¹

23
- 36149020149
- (1965) Phys. Rev. , vol.137 , Issue.3 , pp. 801-818
- Maker, P.D.¹ Terhune, R.W.²

24
- 0016522032
- (1975) IEEE J. Quantum Electron. , vol.QE-11 , Issue.6 , pp. 287-296
- Bjorklund, G.C.¹

25
- 0001112520
- (1958) J. Opt. Soc. Am. B , vol.48 , pp. 304
- Tanaka, Y.¹ Jursa, A.S.² Blanc, F.J.³

26
- 0003354419
- (1984) Top. Appl. Phys. , vol.30 , pp. 47
- McCusker, M.¹

27
- 0025843301
- (1991) Appl. Phys. B , vol.52 , pp. 14
- Gellert, B.B.¹ Kogelschatz, U.²

28
- 0001165792
- (1998) Appl. Phys. Lett. , vol.72 , pp. 22-24
- El-Habachi, A.¹ Schoenbach, K.H.²

29
- 0000768592
- (1997) Rev. Sci. Instrum. , vol.68 , pp. 1360-1364
- Wieser, J.¹ Murnick, D.E.² Ulrich, A.³ Huggins, H.A.⁴ Liddle, A.⁵ Brown, W.L.⁶

30
- 0034437402
- (2000) Laser Part. Beams , vol.18 , pp. 655-660
- Boichenko, A.M.¹ Yakovlenko, S.L.² Trasenko, V.F.³

31
- 1342300250
- (1999) J. Appl. Phys. , vol.86 , pp. 3525
- Ulrich, A.¹ Niessl, C.² Wieser, J.³ Tomizawa, H.⁴ Murnick, D.E.⁵ Salvermoser, M.⁶

32
- 84948599723
- (1974) Jpn. J. Appl. Phys. Suppl. , vol.2 , Issue.1 , pp. 49-52
- Barosi, A.¹ Rabusin, E.²

33
- 33847181474
- (1955) Rev. Sci. Instrum. , vol.26 , pp. 1150-1157
- Wiley, W.C.¹ McLaren, I.H.²

34
- 0035448886
- (2001) Anal. Chem. , vol.73 , pp. 4171-4180
- Hafner, K.¹ Zimmermann, R.² Rohwer, E.R.³ Dorfner, R.⁴ Kettrup, A.⁵

35
- 0003450764
- National Institute of Standards and Technology NIST: Gaithersburg MD, 20899
- (2000) NIST Standard Reference Database , vol.9
- Mallard, W.G.¹ Linstrom, P.J.²

36
- 0000618144
- (1994) Phys. Rev. E , vol.50 , pp. 3973
- Ribitzki, G.¹ Ulrich, A.² Busch, B.³ Krötz, W.⁴ Wieser, J.⁵ Murnick, D.E.⁶

37
- 2142662558
- LeCroy Corporation: Chestnut Ridge NY
- (1992) Instrumentation for Time-of-Flight Mass Spectromety; Proceedings of the 1st International Conference on Instrumentation for Time-of-Flight Mass Spectrometry
- Coles, J.¹ Guilhaus, M.²

38
- 84990678002
- (1994) Rapid Commun. Mass Spectrom. , vol.8 , pp. 720-726
- Laiko, V.V.¹ Dodonov, A.F.²

39
- 84990719386
- (1989) Rapid Commun. Mass Spectrom. , vol.3 , pp. 155-159
- Dawson, J.H.J.¹ Guilhaus, M.²

40
- 0024067778
- (1988) Rapid Commun. Mass Spectrom. , vol.2 , pp. 171-175
- Olthoff, J.K.¹ Lys, I.A.² Cotter, R.J.³

41
- 0002646836
- (1988) Rapid Commun. Mass Spectrom. , vol.2 , pp. 83-85
- Grix, R.¹ Kutscher, R.² Li, G.³ Grüner, U.⁴ Wollnik, H.⁵

42
- 45349113086
- (1989) Int. J. Mass Spectrom. Ion Processes , vol.93 , pp. 323-330
- Grix, R.¹ Grüner, U.² Li, G.³ Stroh, H.⁴ Wollnik, H.⁵

43
- 0039219978
- (1990) Rev. Mod. Phys. , vol.62 , pp. 531-540
- Paul, W.¹

44
- 33646832904
- (1992) Rev. Sic. Instrum. , vol.63 , pp. 4277-4284
- Michael, S.M.¹ Chien, M.² Lubman, D.M.³

45
- 0031201391
- (1997) Anal. Chem. , vol.69 , pp. 2908-2913
- Wu, J.T.¹ Huang, P.² Li, M.X.³ Lubman, D.M.⁴

46
- 0001054330
- (1987) Int. J. Mass Spectrom. Ion Processes , vol.75 , pp. 345
- Louris, J.N.¹ Brodbelt, J.S.² Cooks, R.G.³

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