Compact ultrafast orthogonal acceleration time-of-flight mass spectrometer for on-line gas analysis by electron impact ionization and soft single photon ionization using an electron beam pumped rare gas excimer lamp as VUV-light source

Analytical Chemistry

Volumn 79, Issue 21, 2007, Pages 8118-8124

  Muhlberger, F ^a   Saraji Bozorgzad, M ^a   Gonin, M ^b   Fuhrer, K ^b   Zimmermann, R ^a,c,d  

^a INSTITUTE OF EPIDEMIOLOGY   (Germany)

^b TOFWERK AG   (Switzerland)

^c BIfA GmbH   (Germany)

^d UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM PUMPING; IMPACT IONIZATION; ION BEAMS; MASS SPECTROMETERS; PHOTOIONIZATION; SULFUR DIOXIDE;

DUTY CYCLES; ELECTRON BEAM PUMPED RARE GAS EXCIMER LAMPS (EBEL); SINGLE PHOTON IONIZATION;

ULTRAFAST PHENOMENA;

ARGON LASER; ARTICLE; ELECTRON BEAM; EXCIMER LASER; GAS ANALYSIS; IONIZATION; LIGHT; ONLINE ANALYSIS; TIME OF FLIGHT MASS SPECTROMETRY; ULTRAVIOLET RADIATION;

ACCELERATION; ARGON; ELECTRONS; EQUIPMENT DESIGN; GASES; MOLECULAR STRUCTURE; PHOTONS; SENSITIVITY AND SPECIFICITY; SPECTROMETRY, MASS, ELECTROSPRAY IONIZATION; TIME FACTORS; ULTRAVIOLET RAYS;

EID: 35948965665     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac071217f     Document Type: Article

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