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Journal of Solid State Electrochemistry

Volumn 12, Issue 1, 2008, Pages 95-101

Characterisation of electroplated Bi 2(Te 1-xSe x) 3 alloys

(5) Michel, S a Diliberto, S a Stein, N a Bolle, B b Boulanger, C a

a UNIVERSITÉ DE LORRAINE (France)

b UNIVERSITÉ PAUL VERLAINE METZ (France)

Author keywords

Bismuth compounds; Crystallographic texture; Electrochemical growth; Semiconducting materials; Ternary bismuth telluride alloys

Indexed keywords

CRYSTALLOGRAPHIC TEXTURES; ELECTROCHEMICAL GROWTH; TERNARY BISMUTH TELLURIDE ALLOYS;

BISMUTH ALLOYS; BISMUTH COMPOUNDS; CRYSTALLOGRAPHY; ELECTROCHEMISTRY; ELECTRODEPOSITION; GROWTH (MATERIALS);

SEMICONDUCTOR MATERIALS;

EID: 35548932409 PISSN: 14328488 EISSN: None Source Type: Journal
DOI: 10.1007/s10008-007-0362-9 Document Type: Article

Times cited : (28)

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