Synthesis and Seebeck coefficient of nanostructured phosphorus-alloyed bismuth telluride thick films

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 11, 2008, Pages 3453-3457

  Zhou, Jian ^a   Li, Shanghua ^a   Soliman, Hesham M A ^a,b   Toprak, Muhammet S ^a   Muhammed, Mamoun ^a   Platzek, Dieter ^c   Müller, Eckhard ^c  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b Mubarak City for Scientific Research and Technology Applications ^*  (Egypt)

^c GERMAN AEROSPACE CENTER DLR   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE GRAIN SIZE; BISMUTH TELLURIDE; ELECTROCHEMICAL DEPOSITION; N-TYPE CONDUCTIVITY; NANO-STRUCTURED; SCHERRER'S EQUATION; SITE OCCUPANCY;

BISMUTH; GROWTH (MATERIALS); NANOSTRUCTURES; PHOSPHORUS; REDUCTION; SEEBECK COEFFICIENT; TELLURIUM COMPOUNDS; THICK FILMS;

SYNTHESIS (CHEMICAL);

EID: 69449099178     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200779436     Document Type: Conference Paper

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