EFTEM study of surface plasmon resonances in silver nanoholes

Ultramicroscopy

Volumn 110, Issue 8, 2010, Pages 1094-1100

  Sigle, W ^a   Nelayah, J ^a   Koch, C T ^a   Ogut B ^a   Gu, L ^a   van Aken, P A ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

EFTEM; Surface plasmon resonances

Indexed keywords

COUPLING EFFECT; DISCRETE DIPOLE APPROXIMATION; EFTEM; ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPIES; LOCALIZED PLASMON RESONANCE; LOWER ENERGIES; NANOHOLES;

PLASMONS; SCANNING ELECTRON MICROSCOPY; SILVER; TRANSMISSION ELECTRON MICROSCOPY;

SURFACE PLASMON RESONANCE;

SILVER;

ARTICLE; CALCULATION; CONTROLLED STUDY; DIELECTRIC CONSTANT; DIPOLE; ELECTROMAGNETIC FIELD; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; HYBRIDIZATION; IMAGE ANALYSIS; SURFACE PLASMON RESONANCE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77955515495     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.03.009     Document Type: Article

References (37)

1. Ritchie R.H. Phys. Rev. B 1957, 106:874-881.
2. Raether H. Excitation of Plasmons and Interband Transitions by Electrons 1982, Springer-Verlag, Berlin, Heidelberg, New York.
3. Stockman M.I. Phys. Rev. Lett. 1997, 79:4562-4565.
4. Nie.S.M., Emory S.R. Science 1997, 275:1102-1106.
5. Maier S.A., Atwater H.A. J. Appl. Phys. 2005, 98. 011101-1-10.
6. Kneipp K., Wang Y., Kneipp H., Perelman L.T., Itzkan I., Dasari R.R., Feld M.S. Phys. Rev. Lett. 1997, 78:1667-1670.
7. Esteban R., Vogelgesang R., Dorfmüller J., Dmitriev A., Rockstuhl C., Etrich C., Kern K. Nano Lett. 2009, 8:3155-3159.
8. García de Abajo F.J., Kociak M. Phys. Rev. Lett. 2008, 100. 106804-1-4.
9. Batson P. Phys. Rev. Lett. 1982, 49:936-940.
10. Wang Z.L., Cowley J.M. Ultramicroscopy 1987, 23:97-108.
11. Ugarte D., Colliex C., Trebbia P. Phys. Rev. B 1992, 45:4332-4343.
12. Nelayah J., Kociak M., Stéphan O., García de Abajo F.J., Tencé M., Henrard L., Taverna D., Pastoriza-Santos I., Liz-Marzan L.M., Colliex C. Nat. Phys. 2007, 3:348-353.
13. Bosman M., Keast V.J., Watanabe M., Maaroof A.I., Cortie M.B. Nanotechnology 2007, 18:1-5.
14. Chu M.-W., Myroshnychenko V., Chen C.H., Deng J.P., Mou C.Y., García de Abajo F.J. Nano Lett. 2009, 9:399-404.
15. Nelayah J., Gu L., Sigle W., Koch C.T., Pastoriza-Santos I., Liz-Marzan L.M., van Aken P.A. Proc. 14th European Microscopy Congress, Aachen 2008, vol. 2:243-244. Springer, Berlin.
16. Schaffer B., Riegler K., Grogger W., Hofer F. Micron 2009, 40:269-273.
17. Nelayah J., Gu L., Sigle W., Koch C.T., Pastoriza-Santos I., Liz-Marzan L.M., van Aken P.A. Opt. Lett. 2009, 34:1003-1005.
18. Schaffer B., Hohenester U., Trügler A., Hofer F. Phys. Rev. B 2009, 79. 041401-1-4.
19. Sigle W., Nelayah J., Koch C.T., van Aken P.A. Opt. Lett. 2009, 34:2150-2152.
20. Ebbesen T.W., Lezec H.J., Ghaemi H.F., Thio T., Wolff P.A. Nature 1998, 391:667-669.
21. Catrysse P.B., Fan S.H. J. Nanophotonics 2008, 2. 021790-1-20.
22. Moresco F., Rocca M., Hildebrandt T., Henzler M. Phys. Rev. Lett. 1999, 83:2238-2241.
23. Ouyang F., Isaacson M. Ultramicroscopy 1989, 31:345-350.
24. Koch C.T., Sigle W., Höschen R., Rühle M., Essers E., Benner G., Matijevic M. Microsc. Microanal. 2006, 12:506-514.
25. Uhlemann S., Rose H. Optik 1994, 96:163-178.
26. E. Essers, G. Benner, T. Mandler, S. Meyer, D. Mittmann, M. Schnell, R. Höschen, Ultramicroscopy (2010), this issue, doi: 10.1016/j.ultramic.2010.02.009.
27. Schaffer B., Grogger W., Kothleitner G. Ultramicroscopy 2004, 102:27-36.
28. Egerton R. Electron Energy-Loss Spectroscopy in the Electron Microscope 1996, Plenum Press, New York. second ed.
29. B.T. Draine, P.J. Flatau, User guide for the discrete dipole approximation code DDSCAT.6.0, 〈http://arxiv.org/abs/astro-ph/0309069〉, 2003.
30. N. Geuquet, L. Henrard, Ultramicroscopy, (2010), this issue, doi:10.1016/j.ultramic.2010.01.013.
31. J. Nelayah, Ph.D. Thesis, Université Paris-Sud XI UFR Scientifique d'Orsay, 2007.
32. Kelly K.L., Coronado E., Zhao L.L., Schatz G.C. J. Phys. Chem. B 2003, 107:668-677.
33. Alegret J., Rindzevicius T., Pakizeh T., Alaverdyan Y., Gunnarsson L., Käll M. J. Phys. Chem. C 2008, 112:14313-14317.
34. Romero I., Aizpurua J., Bryant G.W., García de Abajo F.J. Opt. Express 2006, 14:9988-9999.
35. Prodan E., Radloff C., Halas N.J., Nordlander P. Science 2003, 302:419-422.
36. Chu M.-W., Myroshnychenko V., Chen C.H., Deng J.-P., Mou C.-Y., Garcia de Abajo F.J. Nanoletters 2009, 9:399-404.
37. Rindzevicius T., Alaverdyan Y., Sepulveda B., Pakizeh T., Käll M., Hillenbrand R., Aizpurua J., García de Abajo F.J. J. Phys. Chem. C 2007, 111:1207-1212.