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Volumn 615 617, Issue , 2009, Pages 37-40
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High temperature solution growth on free-standing (001) 3C-SiC epilayers
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Author keywords
3C SiC; Dipping method; Solution growth; Stacking faults
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Indexed keywords
EPILAYERS;
STACKING FAULTS;
SUBSTRATES;
3C-SIC;
DIPPING METHOD;
GROWN CRYSTALS;
HIGH TEMPERATURE SOLUTIONS;
SEED CRYSTAL;
SI SUBSTRATES;
SIC EPILAYERS;
SOLUTION GROWTH;
SILICON CARBIDE;
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EID: 77955449080
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/MSF.615-617.37 Document Type: Conference Paper |
Times cited : (1)
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References (13)
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