Anti-buckling S-shaped vertical microprobes with branch springs

Microelectronic Engineering

Volumn 87, Issue 9, 2010, Pages 1769-1776

  Kim, Jung Yup ^a,b   Lee, Hak Joo ^b   Cho, Young Ho ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Institute of Machine and Materials   (South Korea)

Author keywords

Anti buckling; Branch spring; Vertical probe

Indexed keywords

BRANCH SPRING; CONTACT FORCES; DESIGN REQUIREMENTS; IC CHIPS; MICRO-PROBES; NI-CO ELECTROPLATING; PROBE CARDS; S-SHAPED; TEST EQUIPMENTS; VERTICAL PROBE; WAFER LEVEL TESTING;

BUCKLING;

PROBES;

EID: 77955229026     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2009.10.014     Document Type: Conference Paper

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