Performance degradation of pentacene-based organic thin-film transistors under positive drain bias stress in the atmosphere

IEEE Electron Device Letters

Volumn 31, Issue 8, 2010, Pages 887-889

  Fan, Ching Lin ^a   Yang, Tsung Hsien ^a   Chiang, Chin Yuan ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Drain bias stress; organic thin film transistor (OTFT); pentacene; reliability; threshold voltage

Indexed keywords

CARRIER INJECTION; DRAIN BIAS; ELECTRICAL FIELD; GATE INSULATOR; ORGANIC THIN FILM TRANSISTORS; PENTACENES; PERFORMANCE DEGRADATION; RELIABILITY THRESHOLD; TRAP STATE DENSITY; VERTICAL ELECTRICAL FIELDS;

CHEMICAL SENSORS; DEGRADATION; SEMICONDUCTING ORGANIC COMPOUNDS; THRESHOLD VOLTAGE;

THIN FILM TRANSISTORS;

EID: 77955175554     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2010.2051212     Document Type: Article

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