Projection phase contrast microscopy with a hard x-ray nanofocused beam: Defocus and contrast transfer

Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 18, 2009, Pages

  Salditt, T ^a   Giewekemeyer, K ^a   Fuhse, C ^a   Kruger S P ^a   Tucoulou, R ^b   Cloetens, P ^b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67649407772     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.184112     Document Type: Article

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