Transmission electron microscope observation of interface structures of graphene on 6H-SiC

Journal of Nanoscience and Nanotechnology

Volumn 10, Issue 6, 2010, Pages 3884-3889

  Norimatsu, Wataru ^a   Kusunoki, Michiko ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b JAPAN FINE CERAMICS CENTER   (Japan)

Author keywords

Graphene; Transmission electron microscopy

Indexed keywords

BAND GAP ENGINEERING; BI-LAYER; CROSS-SECTIONAL OBSERVATIONS; FIRST-PRINCIPLES CALCULATION; HIGH RESOLUTION; INTERFACE STRUCTURES; SEMICONDUCTING BEHAVIOR; SURFACE DECOMPOSITION; TRANSMISSION ELECTRON; TRANSMISSION ELECTRON MICROSCOPE;

ELECTRONIC STATES; ELECTRONS; GRAPHITE; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

GRAPHENE;

EID: 77954973221     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2010.1998     Document Type: Article

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