X-ray phase contrast microscopy at 300 nm resolution with laboratory sources

Optics Express

Volumn 18, Issue 15, 2010, Pages 15998-16004

  Pelliccia, Daniele ^a   Sorrentino, Andrea ^b   Bukreeva, Inna ^b,c   Cedola, Alessia ^b   Scarinci, Fernando ^b   Ilie, Mihaela ^b   Gerardino, Anna Maria ^b   Fratini, Michela ^b   Lagomarsino, Stefano ^b  

^a MONASH UNIVERSITY   (Australia)

^b IFN CNR   (Italy)

^c LEBEDEV PHYSICAL INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

MICROMETERS; X RAYS;

LABORATORY SET-UP; LABORATORY SOURCE; NM RESOLUTION; ONE DIMENSION; PHASE-CONTRAST IMAGE; REPRESENTATIVE SAMPLE; SPATIAL RESOLUTION; SUBMICROMETER RESOLUTION; SUBMICROMETERS; X RAY BEAM; X RAY PHASE CONTRAST; X-RAY WAVEGUIDES;

X RAY MICROSCOPES;

EID: 77954949495     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.015998     Document Type: Article

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