Morphology and structure of C:Co, C:V, and C:Cu nanocomposite films

Plasma Processes and Polymers

Volumn 6, Issue SUPPL. 1, 2009, Pages

  Berndt, Markus ^a   Krause, Matthias ^a   Abrasonis, Gintautas ^a   Mücklich, Arndt ^a   Munnik, Frans ^a   Kolitsch, Andreas ^a   Möller, Wolfhard ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

Nanocomposites; Raman spectroscopy; Sputtering; Thin films; Transmission electron microscopy (TEM)

Indexed keywords

CARBON PHASE; COSPUTTERING; METAL CONTENT; NANOCOMPOSITE FILM; NANOPARTICLE SIZES; TEM; TEMPERATURE RANGE;

CARBON FILMS; COBALT; COPPER; NANOCOMPOSITES; NANOPARTICLES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSITION METAL COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

COMPOSITE FILMS;

EID: 77954902350     PISSN: 16128850     EISSN: 16128869     Source Type: Journal    
DOI: 10.1002/ppap.200932308     Document Type: Conference Paper

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