Effect of substrate temperature on the structural, optical, and electrical properties of silver-indium-selenide films prepared by using laser ablation

Journal of the Korean Physical Society

Volumn 56, Issue 3, 2010, Pages 836-841

  Pathak, Dinesh ^a   Bedi, R K ^a   Kaur, Davinder ^b  

^a GURU NANAK DEV UNIVERSITY   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY ROORKEE   (India)

Author keywords

Atomic force microscopy; Optical properties of thin films; Semiconductors; X ray diffraction

Indexed keywords

EID: 77954838600     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.56.836     Document Type: Article

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