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Volumn 398-399, Issue , 2001, Pages 427-431
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Characterization of AgInTe2 films grown by a hot wall epitaxy technique on KCl substrates
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Author keywords
AgInTe2 films; Electrical properties and measurements; Hot wall epitaxy; Optical properties; Structural properties
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Indexed keywords
CARRIER CONCENTRATION;
ELECTRIC CONDUCTIVITY;
EPITAXIAL GROWTH;
FILM GROWTH;
GRAIN SIZE AND SHAPE;
LIGHT ABSORPTION;
POTASSIUM COMPOUNDS;
SCANNING ELECTRON MICROSCOPY;
SILVER COMPOUNDS;
SUBSTRATES;
HOT WALL EPITAXY;
THIN FILMS;
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EID: 0035505785
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(01)01387-6 Document Type: Conference Paper |
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Times cited : (21)
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References (22)
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