Structural characterization of polycrystalline Ag-In-Se thin films deposited by e-beam technique

Applied Surface Science

Volumn 254, Issue 6, 2008, Pages 1569-1577

  Colakoglu T ^a   Parlak, M ^a  

^a MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

Author keywords

AFM; Selenium segregation; Silver indium selenide; Ternary compounds; XPS; XRD

Indexed keywords

ENERGY DISPERSIVE X RAY ANALYSIS; SILVER COMPOUNDS; STRUCTURAL ANALYSIS; SURFACE ROUGHNESS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

DATA CARDS; E-BEAM TECHNIQUE;

THIN FILMS;

EID: 37349093487     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.07.092     Document Type: Article

References (37)

1. Shay J.L., and Wernick J.H. Ternary Chalcopyrite Semiconductors: Growth, Electronic Properties, and Applications (1975), Pergamon Press
2. Roy U.N., Cui Y., Hawrami R., Burger A., Orona L., and Goldstein J.T. Solid State Commun. 139 (2006) 527
3. You S.H., Hong K.J., Jeong T.S., Youn C.J., Park J.S., Shin D.C., and Moon J.D. J. Appl. Phys. 95 (2004) 4042
4. Schunemann P.G., Setzler S.D., Pollak T.M., Ohmer M.C., Goldstein J.T., and Zelmon D.E. J. Cryst. Growth 211 (2000) 242
5. Neumann H. Cryst. Res. Technol. 39 (2004) 939
6. Tagirov V.I., Gakhramanov N.F., Guseinov A.G., Aliev F.M., and Guseinov G.G. Kristallografiya 25 (1978) 411
7. Tagirov V.I., Gakhramanov N.F., Guseinov A.G., and Aliev F.M. Fiz. Tekh. Poluprovodn. 14 (1980) 1403
8. Berger L.I., and Prochukhan V.D. Ternary Diamond-Like Semiconductors (1969), Consultants Bureau
9. Tagirov V.I., Guseinov A.G., Gakhramanov N.F., and Aliev F.M. Fiz. Tekh. Poluprovodn. 17 (1983) 524
10. Parlak M., Erçelebi C., Günal I., Özkan H., and Gasanly N.M. Cryst. Res. Technol. 6 (1998) 923
11. Joseph C.M., and Menon C.S. Semicond. Sci. Technol. 11 (1996) 1668
12. Ashour A. J. Mater. Sci. Mater. Electron. 17 (2006) 625
13. Guseinov A.G., Tagirov V.I., and Dzhafarov M.B. Zh. Tekh. Fiz. 60 (1990) 190
14. Watanabe Y., Kaneko S., Kawazoe H., and Yamane M. Phys. Rev. B 40 (1989) 3133
15. Powder Diffraction File, Joint Committee on Powder Diffraction Standards, ASTM, Philadelphia, PA, 2000 (Card 75-0118, Card 83-0039, Card 72-1470, Card 71-0354, Card 89-1516, and Card 27-0603, respectively).
16. Biswas S.K., Chaudhuri S., and Choudhury A. Phys. Status Solidi (a) 105 (1988) 467
17. Fitzgerald A.G. Thin Solid Films 13 (1972) 5
18. Çolakoǧlu T., and Parlak M. Thin Solid Films 492 (2005) 52
19. Watts J.F., and Wolstenholme J. An Introduction to Surface Analysis by XPS and AES (2003), John Wiley and Sons Press
20. Tougaard S. Phys. Rev. B 34 (1986) 6779
21. Peter Y.Yu., and Cardona M. Fundamentals of Semiconductors (2001), Springer-Werlag
22. Pollak R.A., Kowalczyk S.P., Ley L., and Shirley D.A. Phys. Rev. Lett. 29 (1972) 274
23. Miyake I., Tanpo T., and Tatsuyama C. Jpn. J. Appl. Phys. 23 (1984) 172
24. Brinzari V., Korotcenkov G., and Matolin V. Appl. Surf. Sci. 243 (2005) 335
25. Cahen D., Ireland P.J., Kazmerski L.L., and Thiel F.A. J. Appl. Phys. 57 (1985) 4761
26. Hammond J.S., Gaarenstroom S.W., and Winograd N. Anal. Chem. 47 (1975) 2194
27. Zembutsu S. Appl. Phys. Lett. 39 (1981) 969
28. Gaarenstroom S.W., and Winograd N. J. Chem. Phys. 67 (1977) 3500
29. Ueno T., and Odajima A. Jpn. J. Appl. Phys. 20 (1981) 501
30. Clareso C., Grasso V., and Silipigni L. Appl. Surf. Sci. 171 (2001) 306
31. El Maliki H., Marsillac S., Bernede J.C., Faulques E., and Wery J. J. Phys. Condens. Matter 13 (2001) 1839
32. Canava B., Vigneron J., Etcheberry A., Guillemoles J.F., and Lincot D. Appl. Surf. Sci. 202 (2002) 8
33. Balitskii O.A., and Jaegermann W. Mater. Chem. Phys. 97 (2006) 98
34. Galiy P.V., Musyanovych A.V., and Fiyala Ya.M. Physica E 35 (2006) 88
35. Jain H., Kovalskiy A., and Miller A. J. Non-Cryst. Solids 352 (2006) 562
36. Mitkova M., Kozicki M.N., Kim H.C., and Alford T.L. Thin Solid Films 449 (2004) 248
37. Wagner T., Mackova A., Perina V., Rauhala E., Seppala A., Kasap S.O., Frumar M., Vlcek M., and Vlcek M. J. Non-Cryst. Solids 299-302 (2002) 1028