WPPM: Advances in the modeling of dislocation line broadening

Materials Science Forum

Volumn 651, Issue , 2010, Pages 173-186

  Leoni, M ^a   Martinez Garcia, J ^b   Scardi, P ^a  

^a UNIVERSITY OF TRENTO   (Italy)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Dislocations; Line profile analysis; Powder diffraction; Whole powder pattern modeling; X ray diffraction

Indexed keywords

DISLOCATIONS (CRYSTALS); POLYCRYSTALLINE MATERIALS; X RAY DIFFRACTION;

BASIC THEORY; DISLOCATION LINES; LINE PROFILE ANALYSIS; PM2K SOFTWARES; POWDER DIFFRACTION; RECENT PROGRESS; REPRESENTATIVE CASE; WHOLE POWDER PATTERN MODELING;

CRYSTAL SYMMETRY;

EID: 77954770909     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.651.173     Document Type: Conference Paper

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