In situ monitoring of tantalum during electrochemical-mechanically induced oxidation

Electrochemical and Solid-State Letters

Volumn 13, Issue 9, 2010, Pages

  Huitink, David ^a   Gao, Feng ^a   Wang, Ke ^b   Liang, Hong ^a,b  

^a Department of Electrical and Computer Engineering   (United States)

^b TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; ELECTROCHEMICAL POTENTIAL; IN-SITU METHODS; IN-SITU MONITORING; INTERFACIAL STUDY; MATERIAL SYSTEMS; MECHANICAL CONTACT; MECHANICAL STIMULATION;

ELECTROLYTIC CELLS; TANTALUM;

OXIDATION;

EID: 77954728130     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3457845     Document Type: Article

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