Approach to fault identification for electronic products using mahalanobis distance

IEEE Transactions on Instrumentation and Measurement

Volumn 59, Issue 8, 2010, Pages 2055-2064

  Kumar, Sachin ^a   Chow, Tommy W S ^b   Pecht, Michael ^a,b  

^a UNIVERSITY OF MARYLAND   (United States)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Computers; diagnostics; electronic products; fault identification; fault isolation; Mahalanobis distance (MD)

Indexed keywords

CONTROL CHARTS; DIAGNOSTIC APPROACH; ELECTRONIC PRODUCT; EMPIRICAL MODEL; ERROR FUNCTION; FAULT IDENTIFICATIONS; FAULT ISOLATION; HEALTH MONITORING; MAHALANOBIS DISTANCES; NOTE-BOOK COMPUTER; PERFORMANCE PARAMETERS; PROBABILISTIC APPROACHES;

COMPUTER SCIENCE; ELECTRONICS INDUSTRY; LAPTOP COMPUTERS;

IDENTIFICATION (CONTROL SYSTEMS);

EID: 77954623632     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2009.2032884     Document Type: Article

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