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Volumn 58, Issue 2, 2009, Pages 255-262

Improving digital system diagnostics through prognostic and health management (PHM) technology

Author keywords

Accelerated aging; Automated reasoning algorithms; Digital system fault diagnosis; Digital system testing; Microprocessors diagnostics; Physics of failure (PoF) modeling; Prognostic and health management (PHM)

Indexed keywords

AUTOMATION; FEATURE EXTRACTION; HEALTH; MICROPROCESSOR CHIPS; PROBLEM SOLVING; SAFETY ENGINEERING; SIGNAL PROCESSING; SYSTEM THEORY;

EID: 60149093867     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.2005966     Document Type: Article
Times cited : (20)

References (8)
  • 3
    • 60149093632 scopus 로고    scopus 로고
    • JEDEC, Failure Mechanisms and Model for Semiconductor Devices, Aug. 2003. JEP122B.
    • JEDEC, Failure Mechanisms and Model for Semiconductor Devices, Aug. 2003. JEP122B.
  • 4
    • 4644313547 scopus 로고    scopus 로고
    • The case for lifetime reliability-aware micro-processors
    • Jun
    • J. Srinivasan and P. Bose, "The case for lifetime reliability-aware micro-processors," in Proc. ISCA, Jun. 2004, pp. 276-287.
    • (2004) Proc. ISCA , pp. 276-287
    • Srinivasan, J.1    Bose, P.2
  • 5
    • 4444368993 scopus 로고    scopus 로고
    • Leakage aware dynamic voltage scaling for real-time embedded systems
    • San Diego, CA, Jun. 7-11
    • R. Jejurikar, C. Pererira, and R. Gupta, "Leakage aware dynamic voltage scaling for real-time embedded systems," in Proc. DAC, San Diego, CA, Jun. 7-11, 2004, pp. 275-280.
    • (2004) Proc. DAC , pp. 275-280
    • Jejurikar, R.1    Pererira, C.2    Gupta, R.3
  • 7
    • 0036917242 scopus 로고    scopus 로고
    • Combined dynamic voltage scaling and adaptive body biasing for lower power microprocessors under dynamic workloads
    • 2002PC7457EC, Rev 7. Mar
    • S. Martin et al., "Combined dynamic voltage scaling and adaptive body biasing for lower power microprocessors under dynamic workloads," in Proc. Int. Conf. Comput.-Aided Des., 2002, pp. 721-725. 2002PC7457EC, Rev 7. Mar. 2006.
    • (2002) Proc. Int. Conf. Comput.-Aided Des , pp. 721-725
    • Martin, S.1
  • 8
    • 48049090488 scopus 로고    scopus 로고
    • Improving digital system diagnostics through prognostic and health management (PHM) technology
    • Baltimore, MD, Sep. 17-20
    • M. Baybutt, C. Minnella, A. Ginart, P. Kalgren, and M. Roemer, "Improving digital system diagnostics through prognostic and health management (PHM) technology," in Proc. AUTOTESTCON, Baltimore, MD, Sep. 17-20, 2007, pp. 537-546.
    • (2007) Proc. AUTOTESTCON , pp. 537-546
    • Baybutt, M.1    Minnella, C.2    Ginart, A.3    Kalgren, P.4    Roemer, M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.