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Volumn 39, Issue 6, 2010, Pages 819-822

Electron scattering mechanism of FTO films grown by spray pyrolysis method

Author keywords

Electrical resistivity; FTO; Spray pyrolysis method; Transparent conducting film

Indexed keywords

DISLOCATION SCATTERING; ELECTRICAL RESISTIVITY; FLUORINE-DOPED; GLASS SUBSTRATES; GRAIN SIZE; IONIZED IMPURITIES; MEAN FREE PATH; NEUTRAL IMPURITY SCATTERING; SCATTERING MECHANISMS; SPRAY PYROLYSIS METHOD; TEMPERATURE DEPENDENT; TRANSPARENT CONDUCTING FILMS; WORK STUDY;

EID: 77954620956     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-010-1225-1     Document Type: Article
Times cited : (39)

References (20)
  • 15
    • 77954622808 scopus 로고    scopus 로고
    • ICDD No.00-041-1445
    • ICDD No.00-041-1445.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.