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Volumn , Issue , 2010, Pages 824-831

Simulation and experimental investigation of parallel connected IGBTs

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DISTRIBUTION; CURRENT UNBALANCE; DELAY TIME; EXPERIMENTAL INVESTIGATIONS; GATE RESISTANCE; HIGH POWER APPLICATIONS; HIGH-POWER; LARGE POWER; MAXIMUM CURRENT DENSITY; NON DESTRUCTIVE; PARALLEL CONNECTIONS; PARALLEL DEVICES; PARALLEL-CONNECTED; STATE OF THE ART; TEST SETS; VARYING PARAMETERS; VOLTAGE SOURCE CONVERTERS;

EID: 77954388779     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIT.2010.5472617     Document Type: Conference Paper
Times cited : (19)

References (20)
  • 12
  • 14
    • 70249120650 scopus 로고    scopus 로고
    • Active gate control for current balancing in parallel connected igbt modules in solid state modulators
    • June
    • D. Bortis, J. Biela, and J. Kolar, "Active gate control for current balancing in parallel connected igbt modules in solid state modulators," in Pulsed Power Conference, 2007 16th IEEE International, vol. 2, June 2007, pp. 1323-1326.
    • (2007) Pulsed Power Conference, 2007 16th IEEE International , vol.2 , pp. 1323-1326
    • Bortis, D.1    Biela, J.2    Kolar, J.3
  • 17
    • 0031633633 scopus 로고    scopus 로고
    • Physics-based models of power semiconductor devices for the circuit simulator spice
    • R. Kraus, P. Turkes, and J. Sigg, "Physics-based models of power semiconductor devices for the circuit simulator spice," in Proc. PESC1998, Fukuoka, japan, 1998.
    • Proc. PESC1998, Fukuoka, Japan, 1998
    • Kraus, R.1    Turkes, P.2    Sigg, J.3
  • 18
    • 0028497396 scopus 로고
    • An experimentally verified igbt model implemented in the saber circuit simulator
    • A. R. J. Hefner and D. M. Diebolt, "An experimentally verified igbt model implemented in the saber circuit simulator." IEEE Trans. on Power Electronics., 1994.
    • (1994) IEEE Trans. on Power Electronics.
    • Hefner, A.R.J.1    Diebolt, D.M.2
  • 19
    • 0025497993 scopus 로고
    • An improved understanding for the transient operation of the power insulated gate bipolar transistor(igbt)
    • A. R. J. Hefner, "An improved understanding for the transient operation of the power insulated gate bipolar transistor(igbt)." IEEE Trans. on Power Electronics, 1990.
    • (1990) IEEE Trans. on Power Electronics
    • Hefner, A.R.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.