-
1
-
-
0026708845
-
A 360° single-axis tilt stage for the high-voltage electron microscope
-
Barnard D.P., Turner J.N., Frank J., Mcewen B.F. A 360° single-axis tilt stage for the high-voltage electron microscope. J. Microsc. 1992, 167:39-48.
-
(1992)
J. Microsc.
, vol.167
, pp. 39-48
-
-
Barnard, D.P.1
Turner, J.N.2
Frank, J.3
Mcewen, B.F.4
-
2
-
-
0035782662
-
Multiphase method for automatic alignment of transmission electron microscope images using markers
-
Brandt S., Heikkonen J., Engelhardt P. Multiphase method for automatic alignment of transmission electron microscope images using markers. J. Struct. Biol. 2001, 133:10-22.
-
(2001)
J. Struct. Biol.
, vol.133
, pp. 10-22
-
-
Brandt, S.1
Heikkonen, J.2
Engelhardt, P.3
-
3
-
-
0035783045
-
Automatic alignment of transmission electron microscope tilt series without fiducial markers
-
Brandt S., Heikkonen J., Engelhardt P. Automatic alignment of transmission electron microscope tilt series without fiducial markers. J. Struct. Biol. 2001, 136:201-213.
-
(2001)
J. Struct. Biol.
, vol.136
, pp. 201-213
-
-
Brandt, S.1
Heikkonen, J.2
Engelhardt, P.3
-
4
-
-
0000305995
-
Alignment by cross-correlation
-
Plenum Press, New York, J. Frank (Ed.)
-
Frank J., McEwen B.F. Alignment by cross-correlation. Electron Tomography 1992, 205-213. Plenum Press, New York. J. Frank (Ed.).
-
(1992)
Electron Tomography
, pp. 205-213
-
-
Frank, J.1
McEwen, B.F.2
-
5
-
-
13444269537
-
A method for multidirectional TEM observation of a specific site at atomic resolution
-
Kamino T., Yaguchi T., Konno M., Ohnishi T., Ishitani T. A method for multidirectional TEM observation of a specific site at atomic resolution. J. Electron Microsc. 2004, 53:583-588.
-
(2004)
J. Electron Microsc.
, vol.53
, pp. 583-588
-
-
Kamino, T.1
Yaguchi, T.2
Konno, M.3
Ohnishi, T.4
Ishitani, T.5
-
6
-
-
33751225391
-
Transmission electron microtomography without the " missing wedge" for quantitative structural analysis
-
Kawase N., Kato M., Nishioka H., Jinnai H. Transmission electron microtomography without the " missing wedge" for quantitative structural analysis. Ultramicroscopy 2007, 107:8-15.
-
(2007)
Ultramicroscopy
, vol.107
, pp. 8-15
-
-
Kawase, N.1
Kato, M.2
Nishioka, H.3
Jinnai, H.4
-
7
-
-
70350588987
-
Technical note: a tool for determining rotational tilt axis with or without fiducial markers
-
Kobayashi A., Fujigaya T., Itoh M., Taguchi T., Takano H. Technical note: a tool for determining rotational tilt axis with or without fiducial markers. Ultramicroscopy. 2009, 110:1-6.
-
(2009)
Ultramicroscopy.
, vol.110
, pp. 1-6
-
-
Kobayashi, A.1
Fujigaya, T.2
Itoh, M.3
Taguchi, T.4
Takano, H.5
-
8
-
-
0002439918
-
Least-squares methods of alignment using markers
-
Plenum Press, New York, J. Frank (Ed.)
-
Lawrence M.C. Least-squares methods of alignment using markers. Electron Tomography 1992, 197-204. Plenum Press, New York. J. Frank (Ed.).
-
(1992)
Electron Tomography
, pp. 197-204
-
-
Lawrence, M.C.1
-
9
-
-
0038641055
-
3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography
-
Midgley P.A., Weyland M. 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography. Ultramicroscopy 2003, 96:413-431.
-
(2003)
Ultramicroscopy
, vol.96
, pp. 413-431
-
-
Midgley, P.A.1
Weyland, M.2
-
10
-
-
0033007402
-
Automatic acquisition of fiducial markers and alignment of images in tilt series for electron tomography
-
Ress D., Harlow M.L., Schwarz M., Marshall R.M., McMahan U.J. Automatic acquisition of fiducial markers and alignment of images in tilt series for electron tomography. J. Electron Microsc. 1999, 48:277-287.
-
(1999)
J. Electron Microsc.
, vol.48
, pp. 277-287
-
-
Ress, D.1
Harlow, M.L.2
Schwarz, M.3
Marshall, R.M.4
McMahan, U.J.5
-
11
-
-
8844219664
-
Automated spatial drift correction for EFTEM image series
-
Schaffer B., Grogger W., Kothleitner G. Automated spatial drift correction for EFTEM image series. Ultramicroscopy 2004, 102:27-36.
-
(2004)
Ultramicroscopy
, vol.102
, pp. 27-36
-
-
Schaffer, B.1
Grogger, W.2
Kothleitner, G.3
|