Automatic acquisition of fiducial markers and alignment of images in tilt series for electron tomography

Journal of Electron Microscopy

Volumn 48, Issue 3, 1999, Pages 277-287

  Ress, David ^a   Harlow, Mark L ^a   Schwarz, Mikael ^a,b   Marshall, Robert M ^a   McMahan, Uel J ^a  

^a STANFORD UNIVERSITY SCHOOL OF MEDICINE   (United States)

^b Adante Ltd   (Israel)

Author keywords

Electron microscopy; Electron tomography; Fine structure

Indexed keywords

ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS;

AUTOMATIC ACQUISITION; BIOLOGICAL TISSUES; ELECTRON TOMOGRAPHY; FIDUCIAL MARKER; FINE STRUCTURES; POSITION VECTOR; PRECISE ALIGNMENTS; THREE-DIMENSIONAL RECONSTRUCTION; TILT ANGLE; TWO DIMENSIONAL IMAGES;

ALIGNMENT;

EID: 0033007402     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023679     Document Type: Article

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