Low voltage TEM: Influences on electron energy loss spectrometry experiments

Micron

Volumn 41, Issue 6, 2010, Pages 577-584

  Stoger Pollach M ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Energy resolution; Low voltage EELS; Low voltage HRTEM; Low voltage TEM

Indexed keywords

CERENKOV; DELOCALIZATIONS; DETECTING SYSTEMS; ELECTRON ENERGY-LOSS SPECTROMETRY; ENERGY RESOLUTIONS; LOW VOLTAGES; LOWER ENERGIES; PHYSICAL EFFECTS; POINT-SPREAD FUNCTION; SPATIAL RESOLUTION; TEM; TRANSMISSION ELECTRON MICROSCOPE;

DISSOCIATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; NUCLEAR INSTRUMENTATION; OPTICAL TRANSFER FUNCTION; SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY; ELECTRON ENERGY LEVELS; EXPERIMENTS;

ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 77954384257     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2010.04.007     Document Type: Article

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