SCOPUS 정보 검색 플랫폼

Volumn 96, Issue 26, 2010, Pages

Direct-search deep level photothermal spectroscopy: An enhanced reliability method for overlapped semiconductor defect state characterization

(2) Xia, Jun a Mandelis, Andreas a

a DEPARTMENT OF MECHANICAL AND INDUSTRIAL ENGINEERING (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL; DEFECT LEVELS; DEFECT STATE; DIRECT SEARCH OPTIMIZATION; FREQUENCY SCANS; GLOBAL MINIMA; MULTI-PARAMETER FITTING; PATTERN SEARCH ALGORITHM; PHOTO-THERMAL; PHOTOTHERMAL SPECTROSCOPIES; POSSIBLE SOLUTIONS; RELIABILITY METHODS; STATE CHARACTERIZATION;

LASER SPECTROSCOPY; LEARNING ALGORITHMS;

DEFECTS;

EID: 77954333540 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3458827 Document Type: Article

Times cited : (11)

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