Noncontact deep level photo-thermal spectroscopy: Technique and application to semi-insulating GaAs Wafers

Applied Physics Letters

Volumn 90, Issue 6, 2007, Pages

  Xia, Jun ^a   Mandelis, Andreas ^a  

^a DEPARTMENT OF MECHANICAL AND INDUSTRIAL ENGINEERING   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ELECTRON TRAPS; ENERGY GAP; LIGHT ABSORPTION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH;

LOCKIN AMPLIFIERS; PHOTOTHERMAL SPECTROSCOPY; SEMI INSULATING (SI) WAFERS; THERMAL EMISSION;

SPECTROSCOPIC ANALYSIS;

EID: 33846985260     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2437686     Document Type: Article

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