Study of the morphology of NiO nanostructures grown on highly ordered pyrolytic graphite, by the Tougaard method and atomic force microscopy: A comparative study

Surface and Interface Analysis

Volumn 42, Issue 6-7, 2010, Pages 869-873

  Preda, I ^a   Soriano, L ^a   Alvarez, L ^b   Mendez J ^b   Yubero, F ^c   Gutierrez A ^a   Sanz, J M ^a  

^a INSTITUTO NICOLÁS CABRERA   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^c UNIVERSITY OF SEVILLE   (Spain)

Author keywords

AFM; NiO HOPG; XPS quantitative

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAPHITE;

COMPARATIVE STUDIES; HIGHLY ORDERED PYROLYTIC GRAPHITES; NIO NANOSTRUCTURES; NIO/HOPG; PEAK SHAPE ANALYSIS;

NICKEL OXIDE;

EID: 77954273691     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3222     Document Type: Conference Paper

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