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Journal of Electron Spectroscopy and Related Phenomena

Volumn 148, Issue 1, 2005, Pages 29-40

Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure

(2) Walton, John a Fairley, Neal b

a UNIVERSITY OF MANCHESTER (United Kingdom)

b Casa Software Ltd (United Kingdom)

Author keywords

Image; Noise; PCA; Spectromicroscopy; SVD; XPS

Indexed keywords

BINDING ENERGY; DATA ACQUISITION; ELECTRON MICROSCOPES; IMAGE ANALYSIS; PRINCIPAL COMPONENT ANALYSIS; SIGNAL TO NOISE RATIO; SPECTROSCOPIC ANALYSIS; SYNCHROTRON RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL STATE INFORMATION; PHOTOELECTRON PEAK; PHOTOELECTRON SPECTROMICROSCOPY; SINGULAR VALUE DECOMPOSITION (SVD);

NOISE ABATEMENT;

EID: 18544362653 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2005.02.003 Document Type: Article

Times cited : (76)

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