Narrowband midinfrared reflectance filters using guided mode resonance

Analytical Chemistry

Volumn 82, Issue 13, 2010, Pages 5697-5706

  Kodali, Anil K ^a,b   Schulmerich, Matthew ^a,b   Ip, Jason ^b   Yen, Gary ^a,b   Cunningham, Brian T ^a,b   Bhargava, Rohit ^a,b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBANCES; ANGLE OF INCIDENCE; ANOMALOUS DISPERSION; DISPERSION CHARACTERISTICS; FACILE FABRICATION; FILTER MATERIALS; GUIDED-MODE RESONANCE; IR ABSORPTION SPECTROSCOPY; IR SPECTRAL REGIONS; MID-INFRARED REFLECTANCES; MIDINFRARED; NARROW BANDS; OPTICAL REFLECTION; PERIODIC SURFACES; PRACTICAL REALIZATIONS; PROOF OF PRINCIPLES; RATIONAL DESIGN; REFLECTANCE SPECTRUM; RIGOROUS COUPLED WAVE ANALYSIS; SPECTRAL POSITION; SPECTRAL REGION; SPECTRAL RESPONSE; STRETCHING MODES; THEORETICAL MODELS; THERMAL SOURCE; VIBRATIONAL MODES; WIDE-BAND;

DISPERSION (WAVES); GUIDED ELECTROMAGNETIC WAVE PROPAGATION; INFRARED DEVICES; REFLECTION; RESONANCE;

ABSORPTION SPECTROSCOPY;

SILICON DERIVATIVE; SILICON NITRIDE;

ALGORITHM; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; INFRARED SPECTROPHOTOMETRY; METHODOLOGY; VIBRATION; PROCEDURES;

ALGORITHMS; MICROSCOPY, ATOMIC FORCE; SILICON COMPOUNDS; SPECTROPHOTOMETRY, INFRARED; VIBRATION;

EID: 77954191348     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac1007128     Document Type: Article

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