Electric field distribution in resonant reflection filters under normal incidence

Journal of Optics A: Pure and Applied Optics

Volumn 10, Issue 12, 2008, Pages

  Sun, Tianyu ^a,b   Ma, Jianyong ^a,b   Wang, Jianpeng ^a,b   Jin, Yunxia ^a   He, Hongbo ^a   Shao, Jianda ^a   Fan, Zhengxiu ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Electric field enhancement; Fourier model method; Near field distributions; Planar periodic waveguide; Resonant grating waveguide structures; Rigorous coupled wave analysis

Indexed keywords

ELECTRIC FIELD ENHANCEMENT; FOURIER MODEL METHOD; NEAR FIELD DISTRIBUTIONS; PLANAR PERIODIC WAVEGUIDE; RESONANT GRATING WAVEGUIDE STRUCTURES; RIGOROUS COUPLED-WAVE ANALYSIS;

ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; LIGHT MODULATION; MODEL STRUCTURES; OPTICAL FILTERS; PERIODIC STRUCTURES; REFLECTION; WAVEGUIDE COMPONENTS;

ELECTRIC NETWORK ANALYSIS;

EID: 67649835988     PISSN: 14644258     EISSN: 17413567     Source Type: Journal    
DOI: 10.1088/1464-4258/10/12/125003     Document Type: Article

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