Electron microscopy characterization of hexagonal molybdenum trioxide (MoO3) nanorods

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 28, Issue 4, 2010, Pages 726-729

  Ramana, C V ^a   Troitskaia, I B ^b   Atuchin, V V ^b   Ramos, M ^a   Ferrer, D ^c  

^a 500 W University Avenue   (United States)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

^c The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL METHOD; HEXAGONAL PHASE; HEXAGONAL STRUCTURES; HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES; LOW TEMPERATURES; MOLYBDENUM TRIOXIDE; SEM; STRUCTURAL CHARACTERISTICS; TEM;

AMMONIUM COMPOUNDS; ASPECT RATIO; HOLOGRAPHIC INTERFEROMETRY; MOLYBDENUM; MOLYBDENUM OXIDE; NANORODS; NITRIC ACID; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 77954182377     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3397791     Document Type: Conference Paper

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