Hysteresis phenomenon of Oxide-based TFTs as transparent devices under the light illumination

IDW '09 - Proceedings of the 16th International Display Workshops

Volumn 3, Issue , 2009, Pages 1799-1802

  Ha, Tae Jun ^a   Kim, Sun Jae ^a   Lee, Jeong Soo ^a   Lee, Soo Yeon ^a   Park, Hyun Sang ^a   Han, Min Koo ^a   Lee, WooGeun ^b   Yoon, Kapsoo ^b   Lee, Young Wook ^b  

^a Seoul National University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

A-SI:H; DARK STATE; DEEP TRAPS; HYSTERESIS CHARACTERISTICS; HYSTERESIS PHENOMENON; LARGE HYSTERESIS; LIGHT ILLUMINATION; TRAPPED CHARGE;

THIN FILM TRANSISTORS;

HYSTERESIS;

EID: 77954156744     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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