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Volumn 16, Issue 9, 2009, Pages 115-119
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Instability behavior of oxide-based top-gate TFTs under electrical and optical stress test
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE TRAPPING;
THIN FILM CIRCUITS;
THIN FILMS;
THRESHOLD VOLTAGE;
ANNEALING PROCESS;
CHARGE TRAPPING MECHANISMS;
ELECTRICAL STRESS;
ILLUMINATION CONDITIONS;
STRESS BEHAVIOR;
SUBTHRESHOLD SLOPE;
THRESHOLD VOLTAGE SHIFTS;
TIME DEPENDENCY;
THIN FILM TRANSISTORS;
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EID: 63149158762
PISSN: 19385862
EISSN: 19386737
Source Type: Conference Proceeding
DOI: 10.1149/1.2980539 Document Type: Conference Paper |
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Times cited : (5)
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References (8)
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