Young's modulus of nanowires measured by electrostatic attraction: Application to multi-walled carbon nanotubes

Current Nanoscience

Volumn 6, Issue 3, 2010, Pages 249-255

  Touze, Christophe Le ^a   Yeh, Hsiu Lun ^b   Tsai, Chuen Horng ^b,c  

^a INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c INSTITUTE OF NUCLEAR ENERGY RESEARCH   (Taiwan)

Author keywords

Carbon nanotubes; Electrostatic attraction; Nanowires; Young's modulus

Indexed keywords

AS-GROWN; CLOSE DISTANCE; ELECTRICAL BIAS; ELECTRICAL PERTURBATION; ELECTRICAL PROBES; ELECTROSTATIC ATTRACTION; ELECTROSTATIC ATTRACTIONS; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; I - V CURVE; SEM; SEM IMAGE; SHUT DOWN; YOUNG'S MODULUS;

ELASTIC MODULI; ELASTICITY; ELECTRIC FURNACES; ELECTRIC WIRE; ELECTROSTATICS; MULTIWALLED CARBON NANOTUBES (MWCN); NANOWIRES; PROBES; SCANNING ELECTRON MICROSCOPY;

CARBON NANOTUBES;

MULTI WALLED NANOTUBE; NANOWIRE;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRODE; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; PRIORITY JOURNAL; RAMAN SPECTROMETRY; STATIC ELECTRICITY; YOUNG MODULUS;

EID: 77954017711     PISSN: 15734137     EISSN: None     Source Type: Journal    
DOI: 10.2174/157341310791171162     Document Type: Article

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