Electrical characterization of novel PMNT thin-films

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2010, Pages 98-101

  Chen, Wenbin ^a   McCarthy, Kevin G ^b   Çopuroǧlu, Mehmet ^a   O'Brien, Shane ^a   Winfield, Richard ^a   Mathewson, Alan ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

^b UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

Dielectric constant; Dielectric loss tangent; High ; PMNT; Thin film

Indexed keywords

CAPACITANCE VOLTAGE; COMPLEX IMPEDANCE; CURRENT VOLTAGE; DIELECTRIC CONSTANTS; DIELECTRIC LOSS TANGENT; DISSIPATION FACTORS; ELECTRICAL CHARACTERIZATION; FABRICATION PARAMETERS; LEAD MAGNESIUM NIOBATE-LEAD TITANATES; SYSTEMATIC INVESTIGATIONS;

CAPACITANCE; DIELECTRIC DEVICES; MAGNESIUM; MICROELECTRONICS; NIOBIUM COMPOUNDS; PERMITTIVITY; POLYMER BLENDS;

DIELECTRIC LOSSES;

EID: 77953901396     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMTS.2010.5466848     Document Type: Conference Paper

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