Structure and chemistry of the (111) Sc2 O3 / (0001) GaN epitaxial interface

Applied Physics Letters

Volumn 96, Issue 24, 2010, Pages

  Weng, X ^a   Tian, W ^a,b   Schlom, D G ^a,b   Dickey, E C ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b School of Operations Research and Industrial Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE SPACING; ELECTRON ENERGY-LOSS SPECTROMETRY; EPITAXIAL INTERFACES; MISFIT DISLOCATIONS; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

CRYSTAL GROWTH; ENERGY DISSIPATION; GALLIUM ALLOYS; GALLIUM NITRIDE; SCANDIUM; SCANNING ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 77953766599     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3454924     Document Type: Article

References (15)

1. B. P. Gila, F. Ren, and C. R. Abernathy, Mater. Sci. Eng. R. MIGIEA 0927-796X 44, 151 (2004). 10.1016/j.mser.2004.06.001
2. N. G. Weimann, L. F. Eastman, D. Doppalapudi, H. M. Ng, and T. D. Moustakas, J. Appl. Phys. JAPIAU 0021-8979 83, 3656 (1998). 10.1063/1.366585
3. A. M. Herrero, B. P. Gila, C. R. Abernathy, S. J. Pearton, V. Craciun, K. Siebein, and F. Ren, Appl. Phys. Lett. APPLAB 0003-6951 89, 092117 (2006). 10.1063/1.2270058 (Pubitemid 44319948)
4. C. Liu, E. F. Chor, L. S. Tan, and Y. Dong, Appl. Phys. Lett. APPLAB 0003-6951 88, 222113 (2006) 10.1063/1.2209178; (Pubitemid 43839224)
5. D. B. Williams and C. B. Carter, Transmission Electron Microscopy (Plenum, New York, 1996).
6. Nonintentionally doped GaN standard templates, Lumilog S.A., Vallauris, France.
7. J. H. Haeni, C. D. Theis, and D. G. Schlom, J. Electroceram. JOELFJ 1385-3449 4, 385 (2000). 10.1023/A:1009947517710
8. L. L. Smith, S. W. King, R. J. Nemanich, and R. F. Davis, J. Electron. Mater. JECMA5 0361-5235 25, 805 (1996). 10.1007/BF02666640
9. See supplementary material at http://dx.doi.org/10.1063/1.3454924 E-APPLAB-96-005025 for XRD results.
10. D. O. Klenov, L. F. Edge, D. G. Schlom, and S. Stemmer, Appl. Phys. Lett. APPLAB 0003-6951 86, 051901 (2005). 10.1063/1.1857068 (Pubitemid 40661671)
11. J. P. Hirth and J. Lothe, Theory of Dislocations, 2nd ed. (Wiley, New York, 1982).
12. S. J. Pennycook and L. A. Boatner, Nature (London) NATUAS 0028-0836 336, 565 (1988). 10.1038/336565a0 (Pubitemid 19007313)
13. R. D. Leapman and J. A. Hunt, Microsc. Microanal. Microstruct. MMMIEY 1154-2799 2, 231 (1991). 10.1051/mmm:0199100202-3023100
14. Gatan, Inc. Pleasanton, CA.
15. D. C. Joy, in Principles of Analytical Electron Microscopy, edited by, D. C. Joy, A. D. Romig, Jr., and, J. I. Goldstein, (Plenum, New York, 1986), p. 270.