Complete on-wafer noise-figure characterization of 60-ghz differential amplifiers

IEEE Transactions on Microwave Theory and Techniques

Volumn 58, Issue 6, 2010, Pages 1599-1608

  Tiemeijer, Luuk F ^a   Pijper, Ralf M T ^a   Van Der Heijden, Edwin ^a  

^a NXP TSMC Research Centre   (Netherlands)

Author keywords

4 4 noise correlation matrix; 45 nm node CMOS; Integrated circuits; On wafer microwave differential noise figure measurements.

Indexed keywords

CIRCUIT BEHAVIORS; CMOS TECHNOLOGY; NOISE CORRELATION MATRIXES; ON-WAFER; ON-WAFER MEASUREMENTS; OPERATING CONDITION; RF PROBE; SINGLE-ENDED; TWO STAGE;

DIFFERENTIAL AMPLIFIERS; INTEGRATED CIRCUITS; NANOTECHNOLOGY; NOISE FIGURE;

CMOS INTEGRATED CIRCUITS;

EID: 77953610245     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2010.2049167     Document Type: Article

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