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Volumn 57, Issue 7, 2008, Pages 1298-1303

A technique for differential noise figure measurement of differential LNAs

Author keywords

Complementary metal oxide semiconductor (CMOS); Differential low noise amplifier (LNA); Differential noise figure; LNA; Noise measurement; Square Kilometre Array (SKA)

Indexed keywords

COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR (CMOS); DIFFERENTIAL LOW-NOISE AMPLIFIER (LNA); DIFFERENTIAL NOISE FIGURE; LNA; NOISE MEASUREMENT; SQUARE KILOMETRE ARRAY (SKA);

EID: 59049083099     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.917673     Document Type: Article
Times cited : (33)

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  • 2
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    • D. E. Bockelman and W. R. Eisenstadt, "Combined differential and common-mode scattering parameters: Theory and simulation," IEEE Trans. Microw. Theory Tech., vol. 43, no. 7, pp. 1530-1539, Jul. 1995.
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  • 10
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    • Vector corrected on-wafer measurements of noise temperature
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    • M. Weatherspoon and L. Dunleavy, "Vector corrected on-wafer measurements of noise temperature," IEEE Trans. Instrum. Meas., vol. 54, no. 3, pp. 1327-1332, Jun. 2005.
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    • Accuracy improvements in microwave noise parameter measurements
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.